Datasheet

Voltage and frequency (V)
•
Dual display gives simultaneous
readout of mains voltage and
frequency
Loop impedance (Z
I
)
Measure earth-loop or line impedance
•
Advanced and patented loop
measurement technology prevents
RCD tripping and guarantees
consistent readings after multiple
tests
•
0.01 Ω resolution on loop
measurements
•
Auto-null to remove test-lead
resistance from measurement
RCD
Carry out functional trip testing and
current tripping level tests
•
Test wide range of RCDs (all models)
•
Test DC-sensitive and delayed-
response RCDs (1652 and 1653)
•
Automated test sequence function for
rapid RCD testing (1652 and 1653)
•
RCD Tripping Current Test (ramp test)
(1652 and 1653)
•
Wiring connection check indication
for added safety
•
Phase selector switch
Earth resistance (R
E
)
(1653 only)
Measure resistance to earth of
electrodes, stakes and earthing mats
•
Test with auxiliary earth spikes in the
ground
•
Three-wire tests for accurate
measurement
•
User selectable safety voltage level of
50 or 25 V
Phase sequence (1653 only)
•
Test phase sequence rapidly on three
phase systems
Insulation resistance (R
ISO
)
Test the insulation resistance of live
and protective conductors
•
Insulation test voltages of 50, 100,
250, 500 and 1000 V cover all
applications including telecom
(depending on model)
•
Clear indication of applied voltage
•
Auto discharge allows fast and safe
discharge of electrical energy in
capacitive circuits
•
Added safety through live circuit
detection, to check and inhibit test if
circuit under test is live
Prospective short-circuit/
fault current (PSC/PFC)
Measure the potential fault current
between phase/neutral and
earth/neutral conductors
•
Simultaneous read-out with loop
impedance
•
1 A resolution on measurements
Continuity (R
LO
)
Test continuity of live and protective
conductors
•
Time-saving 'auto-null' feature
subtracts lead resistance from
measurements (and stores it in
memory even after power-down)
•
Wiring connection check indication
and live circuit detection for added
safety
•
High-resolution measurements down
to 0.01 Ω
4
-
Z
I
R
ISO
R
LO
6
I
N