NetDAQ Users Manual
Table Of Contents
- 2640A/2645A NetDAQ Users Manual
- 1. Overview
- 2. Preparing for Operation
- Introduction
- Instrument Preparation
- Unpacking and Inspecting the Instrument
- Positioning and Rack Mounting
- Connecting to a Power Source and Grounding
- Universal Input Module Connections
- Digital I/O Connections
- Alarm/Trigger I/O Connections
- External Trigger Wiring for a Group Instrument
- Controls and Indicators
- Front Panel Operating Procedures
- Power-On Options
- Displaying a Monitor Channel
- Displaying the Digital I/O Status
- Displaying the Totalizer Status
- Reviewing and Setting the Base Channel Number
- Reviewing and Setting the Line Frequency
- Reviewing and Setting the Network Type
- Reviewing and Setting the General Network Socket Port
- Reviewing and Setting the General Network IP Address
- Reviewing and Setting the Subnet Mask and Default Gateway
- Viewing the Instrument Ethernet Address
- Host Computer and Network Preparation
- Testing and Troubleshooting
- 3. Configuring NetDAQ Logger for Windows
- Introduction
- Configuring Network Communications
- Configuring the Current Setup
- Setup Files
- Configuring an Instrument
- Configuring Channels
- Configuring Mx+B Scaling From a File
- Entering an Instrument's Description
- Copying a Channels Configuration
- Default Configuration Settings
- Using Configuration Lockout
- Saving an Instrument's Configuration as a Text File
- Configuring the netdaq.ini File
- 4. Operating NetDAQ Logger for
- 5. Using Trend Link for Fluke
- Introduction
- Getting the Right Look for Your Trend Link Chart
- 6. Maintenance
- Introduction
- Self-Test Diagnostics and Error Codes
- Cleaning
- Fuse Replacement
- Performance Test
- Configuring the Performance Test Setup
- Initializing the Performance Test Setup
- Accuracy Performance Tests
- Volts DC Accuracy Test (2640A)
- Volts DC Accuracy Test (2645A)
- Volts AC Accuracy Test
- Frequency Accuracy Test
- Analog Channel Integrity Test
- Computed Channel Integrity Test
- Thermocouple Temperature Accuracy Test
- Open Thermocouple Response Test
- 2-Wire Resistance Accuracy Test (2640A)
- 2-Wire Resistance Accuracy Test (2645A)
- 4-Wire Resistance Accuracy Test (2640A)
- 4-Wire Resistance Accuracy Test (2645A)
- RTD Temperature Accuracy Test (Resistance) (2640A)
- RTD Temperature Accuracy Test (Resistance) (2645A)
- RTD Temperature Accuracy Test (DIN/IEC 751 RTD)
- Digital Input/Output Tests
- Totalizer Tests
- Master Alarm Output Test
- Trigger Input Test
- Trigger Output Test
- Calibration
- Variations in the Display
- Service
- Replacement Parts
- Appendices
- A. Specifications
- Introduction
- 2640A/2645A Combined Specifications
- 2640A Specifications
- 2640A DC Voltage Measurement Specifications
- 2640A AC Voltage Measurement Specifications
- 2640A 4-Wire Resistance Measurement Specifications
- 2640A 2-Wire Resistance Measurement Specifications
- 2640A RTD's 4-Wire, per ITS-1990 Measurement Specifications
- 2640A RTD's 2-Wire per ITS-1990 Measurement Specifications
- 2640A Thermocouple per ITS-1990 Measurement Specifications
- 2640A Frequency Measurement Specifications
- 2645A Specifications
- 2645A DC Voltage Measurement Specifications
- 2645A AC Voltage Measurement Specifications
- 2645A 4-Wire Resistance Measurement Specifications
- 2645A 2-Wire Resistance Measurement Specifications
- 2645A 4-Wire RTD per ITS-1990 Measurement Specifications
- 2645A Thermocouple per ITS-1990 Measurement Specifications
- 2645A Frequency Measurement Specifications
- B. Noise, Shielding, and Crosstalk Considerations
- C. True-RMS Measurements
- D. RTD Linearization
- E. Computed Channel Equations
- F. Data File Format
- G. Dynamic Data Exchange (DDE)
- H. Ethernet Cabling
- I. Network Considerations
- J. Error Messages & Exception Conditions
- K. Fluke Service Centers
- A. Specifications
- Index
- Instrument Parameter Record (Isolated Network)
- Instrument Parameter Record (General Network)
- General Network Parameter Record
- Host Computer General Network Parameter Record
2640A/2645A NetDAQ
Users Manual
1-8
Alarms 1-7.
Two alarms, Alarm 1 and Alarm 2, can be applied to any configured channel. An
alarm condition occurs when a measurement falls below a low alarm value or
rises above a high alarm value. You can use alarms to trigger scanning (see
“Alarm Triggering”) and to set a Digital I/O line to a logic low (see “Digital I/O”
below). NetDAQ Logger displays and records alarm conditions.
If you apply Mx+B scaling as part of the channel configuration, the instrument
bases the alarms on the scaled values. When any configured channel is in alarm,
the ALARM annunciator is on dim, or bright if a channel in alarm is being used as
an Alarm Trigger. When a channel is in alarm, the rear-panel Master Alarm
output is asserted (logic low). NetDAQ Logger displays and records alarm
conditions.
Channel Monitoring 1-8.
Channel monitoring takes place at the front panel of the instrument. Use the front
panel MON key and arrow keys to select a channel for monitoring. NetDAQ
Logger also allows the selection of a channel to monitor during scanning. For an
example of a front panel display of the instrument during monitoring, see Figure
1-3. The channel monitoring display updates once per second (nominal).
Digital I/O 1-9.
Eight general-purpose open-collector Transistor-Transistor Logic (TTL) digital
input/output (I/O) lines are available at the instrument rear-panel DIGITAL I/O
connector, terminals 7 through 0 (Figure 1-4). A logic low externally applied to an
I/O line is an input; a logic low internally set by the instrument is an output. An
output logic low condition takes precedence over an input logic high condition.
When the I/O lines are used as inputs, they signal an external condition that can
be correlated to the data measurements.
NetDAQ Logger displays and records the status of the Digital I/O as the decimal
equivalent of the eight binary bits. For example, 11111111 (DIO7 to DIO0) is
represented by decimal 255; 00001111 is represented by decimal 15.
The instrument can display the Digital I/O status in binary format at the front
panel with updates each second.
Totalizer 1-10.
The totalizer input counts contact closures or voltage transitions with a maximum
count of 4,294,967,295. The connections for the totalizer input line are at the
instrument rear panel DIGITAL I/O connector, terminals Σ and GND (Figure 1-
4). The instrument continuously detects the totalizer input on the rear panel
independently from instrument scanning and other activities. If the Totalizer