NetDAQ Users Manual
Table Of Contents
- 2640A/2645A NetDAQ Users Manual
- 1. Overview
- 2. Preparing for Operation
- Introduction
- Instrument Preparation
- Unpacking and Inspecting the Instrument
- Positioning and Rack Mounting
- Connecting to a Power Source and Grounding
- Universal Input Module Connections
- Digital I/O Connections
- Alarm/Trigger I/O Connections
- External Trigger Wiring for a Group Instrument
- Controls and Indicators
- Front Panel Operating Procedures
- Power-On Options
- Displaying a Monitor Channel
- Displaying the Digital I/O Status
- Displaying the Totalizer Status
- Reviewing and Setting the Base Channel Number
- Reviewing and Setting the Line Frequency
- Reviewing and Setting the Network Type
- Reviewing and Setting the General Network Socket Port
- Reviewing and Setting the General Network IP Address
- Reviewing and Setting the Subnet Mask and Default Gateway
- Viewing the Instrument Ethernet Address
- Host Computer and Network Preparation
- Testing and Troubleshooting
- 3. Configuring NetDAQ Logger for Windows
- Introduction
- Configuring Network Communications
- Configuring the Current Setup
- Setup Files
- Configuring an Instrument
- Configuring Channels
- Configuring Mx+B Scaling From a File
- Entering an Instrument's Description
- Copying a Channels Configuration
- Default Configuration Settings
- Using Configuration Lockout
- Saving an Instrument's Configuration as a Text File
- Configuring the netdaq.ini File
- 4. Operating NetDAQ Logger for
- 5. Using Trend Link for Fluke
- Introduction
- Getting the Right Look for Your Trend Link Chart
- 6. Maintenance
- Introduction
- Self-Test Diagnostics and Error Codes
- Cleaning
- Fuse Replacement
- Performance Test
- Configuring the Performance Test Setup
- Initializing the Performance Test Setup
- Accuracy Performance Tests
- Volts DC Accuracy Test (2640A)
- Volts DC Accuracy Test (2645A)
- Volts AC Accuracy Test
- Frequency Accuracy Test
- Analog Channel Integrity Test
- Computed Channel Integrity Test
- Thermocouple Temperature Accuracy Test
- Open Thermocouple Response Test
- 2-Wire Resistance Accuracy Test (2640A)
- 2-Wire Resistance Accuracy Test (2645A)
- 4-Wire Resistance Accuracy Test (2640A)
- 4-Wire Resistance Accuracy Test (2645A)
- RTD Temperature Accuracy Test (Resistance) (2640A)
- RTD Temperature Accuracy Test (Resistance) (2645A)
- RTD Temperature Accuracy Test (DIN/IEC 751 RTD)
- Digital Input/Output Tests
- Totalizer Tests
- Master Alarm Output Test
- Trigger Input Test
- Trigger Output Test
- Calibration
- Variations in the Display
- Service
- Replacement Parts
- Appendices
- A. Specifications
- Introduction
- 2640A/2645A Combined Specifications
- 2640A Specifications
- 2640A DC Voltage Measurement Specifications
- 2640A AC Voltage Measurement Specifications
- 2640A 4-Wire Resistance Measurement Specifications
- 2640A 2-Wire Resistance Measurement Specifications
- 2640A RTD's 4-Wire, per ITS-1990 Measurement Specifications
- 2640A RTD's 2-Wire per ITS-1990 Measurement Specifications
- 2640A Thermocouple per ITS-1990 Measurement Specifications
- 2640A Frequency Measurement Specifications
- 2645A Specifications
- 2645A DC Voltage Measurement Specifications
- 2645A AC Voltage Measurement Specifications
- 2645A 4-Wire Resistance Measurement Specifications
- 2645A 2-Wire Resistance Measurement Specifications
- 2645A 4-Wire RTD per ITS-1990 Measurement Specifications
- 2645A Thermocouple per ITS-1990 Measurement Specifications
- 2645A Frequency Measurement Specifications
- B. Noise, Shielding, and Crosstalk Considerations
- C. True-RMS Measurements
- D. RTD Linearization
- E. Computed Channel Equations
- F. Data File Format
- G. Dynamic Data Exchange (DDE)
- H. Ethernet Cabling
- I. Network Considerations
- J. Error Messages & Exception Conditions
- K. Fluke Service Centers
- A. Specifications
- Index
- Instrument Parameter Record (Isolated Network)
- Instrument Parameter Record (General Network)
- General Network Parameter Record
- Host Computer General Network Parameter Record

2640A/2645A NetDAQ
Users Manual
4-20
Optimizing Performance 4-18.
You can set up instrument operations to optimize either your system’s data
collection rate or measurement precision, depending on your requirements. The
procedures in this section describe the options for optimizing performance.
Optimizing Performance for Speed 4-19.
To optimize the data collection rate of your system, you can alter the parameters
that affect the instrument’s scanning rate, the data put through from the
instrument to the data file, or the speed of the network.
Increasing Scanning Rate 4-20.
Follow these guidelines to increase the rate at which an instrument collects data.
• Select the Fast Reading Rate.
• Use similar functions on contiguous channels. For example, if measuring dc
volts on four channels and thermocouple on four channels, configure channels
1, 2, 3, and 4 for dc volts, and channels 5, 6, 7, and 8 for thermocouples. (See
“Configuring Analog Channel Functions.”)
• Turn the Drift Correction feature off.
• Turn the Open Thermocouple Detect feature off.
• Do not use the Trigger Output function.
• Do not monitor channel readings, DIO or totalizer status at the instrument
front panel.
The following measurement features can also slow down scanning.
• Slow measurement functions such as frequency and ac volts.
• Using Autorange for range selection.
• The use of computed channels.
• Mx+B scaling.
• Channel alarms.
Increasing Data Transmission and Storage Rate 4-21.
Follow these guidelines to increase the rate of data throughput from the
instrument to the data file.
• Select Fast Binary as the data file format.
• Do not have more instruments logging than are necessary.










