Datasheet

© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com
FSA2271T Rev. 1.0.6 4
FSA2271T Low-Voltage, Dual-SPDT (0.4) Analog Switch with Negative Swing Audio Capability
DC Electrical Characteristics
All typical values are for V
CC
=3.3V at 25°C unless otherwise specified.
Symbol
Parameter
Conditions
V
CC
(V)
T
A
=+25°C
T
A
=-40 to
+85°C
Units
Min.
Typ.
Max.
Min.
Max.
V
IH
Input Voltage High
3.60 to 4.30
1.7
2.70 to 3.60
1.5
V
2.30 to 2.70
1.4
1.65 to 1.95
0.9
V
IL
Input Voltage Low
3.60 to 4.30
0.7
V
2.70 to 3.60
0.5
V
2.30 to 2.70
0.4
1.65 to 1.95
0.4
I
IN
Control Input Leakage
(S1,S2)
V
IN
=0 to V
CC
1.65 to 4.30
-0.5
0.5
µA
I
A(ON)
On Leakage Current of
Port nA
nA=0.3V, V
CC
0.3V; nB0 or
nB1 (on)=nA or Floating; nB0
or nB1 (off)=0V or floating
Figure 5
1.95 to 4.30
-1
1
µA
I
OFF
Power Off Leakage Current
(Common Port Only 1A,
2A)
Common Port (1A, 2A);
V
IN
=0V to 4.3V, V
CC
=0V; nB0,
nB1=0V or Floating
0
±45
µA
R
ON
Switch On Resistance
(2)
I
ON
=100mA, nB0 or nB1=0V,
0.7V, 3.6V, 4.3V
Figure 3
4.30
0.3
I
ON
=100mA, nB0 or nB1=0V,
0.7V, 2.3V, 3.0V
Figure 3
3.00
0.4
0.8
I
ON
=100mA, nB0 or nB1=0V,
0.7V, 1.6V, 2.3V
Figure 3
2.30
0.52
I
ON
=100mA, nB0 or nB1=0V,
0.7V, 1.65V
Figure 3
1.65
1.00
∆ R
ON
On Resistance Matching
Between Channels
(3
I
ON
=100mA, nB0 or nB1=0.7V
4.30
0.04
0.13
3.00
0.06
0.13
2.30
0.12
1.65
1.00
R
FLAT(ON)
On Resistance Flatness
(4)
I
OUT
=100mA, nB0 or nB1=0V
to V
CC
4.30
0.25
3.00
0.25
2.30
0.5
1.65
0.6
R
TERM
Internal Termination
Resistors
(5)
10
kΩ
I
CC
Quiescent Supply Current
V
IN
=0 or V
CC
, I
OUT
=0
4.30
-100
100
-500
500
nA
I
CCT
Increase in I
CC
per Input
Input at 2.6V
4.30
3.0
10.0
µA
Input at 1.8V
7.0
15.0
Notes:
2. On resistance is determined by the voltage drop between the A and B pins at the indicated current through the switch.
3. ∆ R
ON
=R
ON max
R
ON min
measured at identical V
CC
, temperature, and voltage.
4. Flatness is defined as the difference between the maximum and minimum value of on resistance over the specified range of
conditions.
5. Guaranteed by characterization, not production tested.