Datasheet

Everlight Electronics Co., Ltd. http:\\www.everlight.com Rev 1 Page: 6 of 6
Device NoCDRX-810-005 Prepared date2006/7/26 Prepared by zhouhong
ITR8102
Reliability Test Item And Condition
The reliability of products shall be satisfied with items listed below.
Confidence level90%
LTPD10%
NO.
Item Test Condition
Test
Hours/
Cycle
Sample
Size
Failure
Judgement
Criteria
Ac/Re
1 Solder Heat
TEMP : 260 ± 5
10sec 22 pcs 0/1
2 Temperature Cycle
H : +100 15 mins
5 min
L : -40 15 min
300
cycle
22 pcs
I
R
U×2
EeL×0.8
V
F
U×1.2
0/1
3 Thermal Shock
H : +100 5 min
10 sec
L : -10 5 min
300
cycle
22 pcs
U :Upper
specification
limit
L :Lower
specification
limit
0/1
4 High Temperature
Storage
TEMP. : +100
1000 hrs 22 pcs 0/1
5 Low Temperature
Storage
TEMP. : -40
1000 hrs 22 pcs 0/1
6
DC Operating Life
V
CE
=5V
I
F
=20mA
1000 hrs 22 pcs 0/1
7 High Temperature /
High Humidity
85 / 85% R.H.
1000 hrs 22 pcs
0/1
EVERLIGHT ELECTRONICS CO., LTD. Tel: 886-2-2267-2000, 2267-9936
Office: No 25, Lane 76, Sec 3, Chung Yang Rd, Fax: 886-2267-6244, 2267-6189, 2267-6306
Tucheng, Taipei 236, Taiwan, R.O.C http:\\www.everlight.com