Datasheet

Everlight Electronics Co., Ltd. http:\\www.everlight.com Rev3.0 Page: 6 of 7
Device No
：
DIH-020-007 Prepared date
：
06-08-2004 Prepared by
：
JAINE TSAI
HIR204/H0
Reliability Test Item And Condition
The reliability of products shall be satisfied with items listed below.
Confidence level：90%
LTPD：10%
NO. Item Test Conditions Test Hours/
Cycles
Sample
Sizes
Failure
Judgement
Criteria
Ac/Re
1 Solder Heat
TEMP.：260℃± 5℃
10secs 22pcs 0/1
2 Temperature Cycle
H : +100℃ 15mins
5mins
L : -40℃ 15mins
50Cycles 22pcs 0/1
3 Thermal Shock
H :+100℃ 5mins
10secs
L :-10℃ 5mins
50Cycles 22pcs 0/1
4 High Temperature
Storage
TEMP.：+100℃
1000hrs 22pcs 0/1
5 Low Temperature
Storage
TEMP.：-40℃
1000hrs 22pcs 0/1
6 DC Operating Life I
F
=20mA 1000hrs 22pcs 0/1
7 High Temperature/
High Humidity
85℃ / 85% R.H
1000hrs 22pcs
I
R
≧U× 2
Ee≦L× 0.8
V
F
≧U×1.2
U：Upper
Specification
Limit
L：Lower
Specification
Limit
0/1