Datasheet

6 PIN DIP RANDOM-PHASE TRIAC DRIVER
PHOTOCOUPLER
Everlight Electronics Co., Ltd. 5 http://www.everlight.com
Document No：DPC-717-052 Rev. 2 August 14, 2008
EL301X Series
EL302X Series
EL305X Series
Figure 8. Static dv/dt Test Circuit & Waveform
Measurement Method
The high voltage pulse is set to the required V
PEAK
value and applied to the D.U.T. output side through the RC
circuit above. LED current is not applied. The waveform V
T
is monitored using a x100 scope probe. By
varying R
TEST
, the dv/dt (slope) is increased, until the D.U.T. is observed to trigger (waveform collapses). The
dv/dt is then decreased until the D.U.T. stops triggering. At this point, τ
RC
is recorded and the dv/dt
calculated.
V
PEAK
0
A
pplied V
Wavefor
T
m
τ
RC
0.632 x V
PEAK
50 Ω
10 kΩ
D.U.T.
R
TEST
T1
A
High Voltage
Pulse Source
C
TEST
V
T
K
T2
0.632 x V
PEAK
τ
RC
dv/dt =