Specifications

3 C33 Test Functions
58
EPSON
S1C33 ASIC DESIGN GUIDE
EMBEDDED ARRAY S1X50000 SERIES
Figure 3.2 Sample Pattern Waveforms
Group: A
P_OSC3 = X
P_TST = 0
P_RESETX = 0
P_A1 = x
P_BCLK = x
LG = x
P_X2SPDX = 0
P_EA10M1 = 0
P_EA110M0 = 0
tst_dct = x
tst_ts = x
tst_te_x = x
tst_ta = x
P_D%[15:0] = 'h xxxx
x x
x
FFFF
0000 FFFF
FFFF
0000
DC/AC test mode
input sequence
Quiescent
current drain
measurement
Bidirectional:
input
3-state:
high
Quiescent
current drain
measurement
Bidirectional:
output
3-state:
output
Output characteristics
(V
OH/VOL) measurement
Special-purpose AC
path measurement
Input: P_EA10M1
Output: P_A1
Input level verification
Input: Arbitrary input pin
In simulation, high/low levels are
forced on the XITST1 LG pin.
Output: P_BCLK
Cursor1 = 0 ps
0
2,000,000
4,000,000 6,000,000
8,000,000
11,213,008 ps
Cursor2 = 11,213,008 ps