Specifications

3 C33 Test Functions
S1C33 ASIC DESIGN GUIDE
EPSON
57
EMBEDDED ARRAY S1X50000 SERIES
108 111P11L000000000000000000ZH Since this example is the result of simulating
110 111P11L000000000000000000ZH forcing high/low data on the XITST1 (P_TST)
113 111P01L000000000000000000ZH LG pin, the high/low state can be verified from the
115 111P11H000000000000000000ZH P_BCLK pin.
118 111P01H000000000000000000ZH
120 111P01H000000000000000000ZH
123 111P01L000000000000000000ZH
125 111P01L000000000000000000ZH
128 111P01H000000000000000000ZH
130 111P01H000000000000000000ZH
133 111P01L000000000000000000ZH
135 111P01L000000000000000000ZH
140 111P01L000000000000000000ZH
$ENDPATTERN
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# EOF