Specifications

3 C33 Test Functions
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EPSON
S1C33 ASIC DESIGN GUIDE
EMBEDDED ARRAY S1X50000 SERIES
Chapter 3 C33 Test Functions
3.1 Test Function Overview
The C33 macros provide an extensive set of test modes for testing and pre-shipment inspection of the
C33 CPU core, I/O, and user circuits. Of these, the following two test modes are provided for use by
the user. Note that the test mode is set up by the four pins P_TST, P_RESETX, P_X2SPD, and
P_EA10M0, which are C33 macro required pins.
(1) DC/AC test mode (TST_DCT mode)
This mode allows the testing of all I/O pins to be controlled from the test input pins, and makes
DC/AC testing easy to perform. The C33 macros include the TCIR test circuit, which is
recommended for the S1X50000 Series, and XACPI, which is used for AC path measurement.
DC/AC testing uses the TCIR and XACPI functions. The following 4 DC/AC tests can be
performed by using the C33 macro built-in TCIR circuit.
a. DC tests
1. Quiescent current drain measurement
2. Output characteristics (V
OH
/V
OL
) measurement
3. Input logic level validation
b. AC test
1.Special-purpose AC path measurement
(2) User circuit test mode (TST_USER mode)
In this test mode, addresses, data, read, write, chip enable, and data bus direction control
functionality can all be controlled directly from pads. This mode allows to access user circuit
internal registers.
Note that the C33 system clock stops in this test mode.