Datasheet

A further advantage of adhesion is that the components are subjected to virtually no temperature
shock at all. The curing temperatures of the adhesives are between 120 °C and 180 °C, typical
curing times are between 30 minutes and one hour.
The bending strength of glued chips is, in comparison with that of soldered chips, higher by a fac-
tor of at least 2, as is to be expected due to the elasticity of the glued joints.
The lower conductivity of conductive adhesive may lead to higher contact resistance and thus re-
sult in electrical data different to those of soldered components. Users must pay special attention
to this in RF applications.
6 Solderability tests
Test Standard Test conditions
Sn-Pb soldering
Test conditions
Pb-free soldering
Criteria/ test results
Wettability IEC
60068-2-58
Immersion in
60/40 SnPb solder
using non-activated
flux at 215 ± 3 °C
for 3 ± 0.3 s
Immersion in
Sn96.5Ag3.0Cu0.5
solder using non- or
low activated flux
at 245 ± 5 °C
for 3 ± 0.3 s
Covering of 95% of
end termination,
checked by visual
inspection
Leaching
resistance
IEC
60068-2-58
Immersion in
60/40 SnPb
solder using
mildly activated flux
without preheating
at 260 ± 5 °C
for 10 ±1 s
Immersion in
Sn96.5Ag3.0Cu0.5
solder using non- or
low activated flux
without preheating
at 255 ± 5 °C
for 10 ±1 s
No leaching of
contacts
Thermal shock
(solder shock)
Dip soldering at
300 °C/5 s
Dip soldering at
300 °C/5 s
No deterioration of
electrical parameters.
Capacitance change:
±15%
Tests of resistance
to soldering heat
for SMDs
IEC
60068-2-58
Immersion in
60/40 SnPb for 10 s
at 260 °C
Immersion in
Sn96.5Ag3.0Cu0.5
for 10 s at 260 °C
Change of varistor
voltage:
±5%
Tests of resistance
to soldering heat
for radial leaded
components
(SHCV)
IEC
60068-2-20
Immersion
of leads in
60/40 SnPb
for 10 s at 260 °C
Immersion
of leads in
Sn96.5Ag3.0Cu0.5
for 10 s at 260 °C
Change of varistor
voltage: ±5%
Change of
capacitance X7R:
5/+10%
Multilayer varistors (MLVs)
Standard series
Page 72 of 81Please read Cautions and warnings and
Important notes at the end of this document.