Instruction Manual
Instruction Manual
D103434X012
Blocks
November 2014
155
Table B‐47. Resource Block Parameter Definitions (Continued)
Label
PARAMETER_NAME
Index
Number
RO /
RW
Mode Range
Initial
Value
Description
Miscellaneous Options
MISC_OPTIONS
45 RO
Bit 0: Software
download
‐
Data Type: Bit String
Firmware Revision
FIRMWARE_REVISION
46
Data Type: Uint8
Describes software revision information. This is
the revision of the firmware that is currently in
use.
FIRMWARE_REV_MAJOR 46.1 RO NA NA
FIRMWARE_REV_MINOR 46.2 RO NA NA
FIRMWARE_REV_BUILD 46.3 RO NA NA
IO_FIRMWARE_REV 46.4 RO NA NA
DIAG_CAL_REV 46.5 RO NA NA
FIRMWARE_REV_ALL 46.6 RO NA NA
Data Type: Visible String
Describes software revision information.
Hardware Revision
HARDWARE_REV
47 RO NA NA
Data Type: Uint8
Describe electronic hardware revision
information.
LABEL_SITE_ID
48 RO NA NA
Data Type: Visible String
Fisher entity code for site that applies the serial
plate to the instrument.
Instrument Model Number
INSTR_MODEL_NUM
49 RO NA NA Data Type: Visible String
SALE_SITE_ID
50 RO NA NA
Data Type: Visible String
Fisher entity code for sales site that ships the
instrument to the customer
Shop Order Number
SHOP_ORDER_NO
51 RO NA NA
Data Type: Uint32
Tracking string associated with a batch of
instruments manufactured together, usually
over the timeframe of a week or two.
HI_POT_TEST_DATE
52 RO NA NA
Data Type: Visible String
Date on which this instrument passed the
dielectric strength test required by the
hazardous area approval.
Terminal Box ID
TERM_BOX_ID
53 RO NA NA
Data Type: Visible String
String that encodes the year and week during
which the terminal box was manufactured.
LEVER_ASSY_ID
54 RO NA NA
Data Type: Visible String
String that identifies the magnet / lever
assembly processing batch.
COMM_MODULE_ID
55 RO NA NA
Data Type: Visible String
Unique string identifying the communications
module test record in the manufacturing test
data base.
DETAILED STATUS
56 RW Bit 28
28:NV
Integrity Error
Data Type: Bit String
NV Integrity Error will activate when there is a
problem reading a non‐transducer block
parameter from non‐volatile memory.