Data Sheet

CC1101
SWRS061B Page 83 of 93
33.2 Configuration Register Details – Registers that Loose Programming in SLEEP State
0x29: FSTEST – Frequency Synthesizer Calibration Control
Bit Field Name Reset R/W Description
7:0 FSTEST[7:0] 89 (0x59) R/W For test only. Do not write to this register.
0x2A: PTEST – Production Test
Bit Field Name Reset R/W Description
7:0 PTEST[7:0] 127 (0x7F) R/W Writing 0xBF to this register makes the on-chip temperature sensor
available in the IDLE state. The default 0x7F value should then be
written back before leaving the IDLE state.
Other use of this register is for test only.
0x2B: AGCTEST – AGC Test
Bit Field Name Reset R/W Description
7:0 AGCTEST[7:0] 63 (0x3F) R/W For test only. Do not write to this register.
0x2C: TEST2 – Various Test Settings
Bit Field Name Reset R/W Description
7:0 TEST2[7:0] 136 (0x88) R/W
The value to use in this register is given by the SmartRF
®
Studio
software [7]. This register will be forced to 0x88 or 0x81 when it wakes
up from SLEEP mode, depending on the configuration of FIFOTHR.
ADC_RETENTION.
0x2D: TEST1 – Various Test Settings
Bit Field Name Reset R/W Description
7:0 TEST1[7:0] 49 (0x31) R/W
The value to use in this register is given by the SmartRF
®
Studio
software [7]. This register will be forced to 0x31 or 0x35 when it wakes
up from SLEEP mode, depending on the configuration of FIFOTHR.
ADC_RETENTION.
0x2E: TEST0 – Various Test Settings
Bit Field Name Reset R/W Description
7:2 TEST0[7:2] 2 (0x02) R/W
The value to use in this register is given by the SmartRF
®
Studio
software [7].
1 VCO_SEL_CAL_EN 1 R/W Enable VCO selection calibration stage when 1
0 TEST0[0] 1 R/W
The value to use in this register is given by the SmartRF
®
Studio
software [7].