Data Sheet

CC1101
SWRS061B Page 13 of 93
Parameter Min Typ Max Unit Condition/Note
Spurious
emissions,
conducted
Harmonics not
included
315 MHz
433 MHz
868 MHz
915 MHz
< -58
< -53
< -50
< -54
< -56
< -50
< -51
< -53
< -51
< -51
dBm
Measured with 10 dBm CW, TX frequency at 315.00 MHz,
433.00 MHz, 868.00 MHz or 915.00 MHz
Frequencies below 960 MHz
Frequencies above 960 MHz
Frequencies below 1 GHz
Frequencies above 1 GHz
Frequencies within 47-74, 87.5-118, 174-230, 470-862 MHz
Frequencies below 1 GHz
Frequencies above 1 GHz
Frequencies within 47-74, 87.5-118, 174-230, 470-862 MHz.
All radiated spurious emissions are within the limits of ETSI. The
peak conducted spurious emission is -53 dBm at 699 MHz, which
is in a frequency band limited to -54 dBm by EN 300 220. An
alternative filter that can be used to reduce the emission at 699
MHz below -54 dBm, for conducted measurements, is shown in
Figure 4.
Frequencies below 960 MHz
Frequencies above 960 MHz
General
TX latency 8 bit Serial operation. Time from sampling the data on the transmitter
data input pin until it is observed on the RF output ports.
Table 6: RF Transmit Section
4.4 Crystal Oscillator
Tc = 25°C @ VDD = 3.0 V if nothing else is stated.
Parameter Min Typ Max Unit Condition/Note
Crystal frequency 26 26 27 MHz
Tolerance ±40 ppm This is the total tolerance including a) initial tolerance, b) crystal
loading, c) aging, and d) temperature dependence.
The acceptable crystal tolerance depends on RF frequency and
channel spacing / bandwidth.
ESR 100
Start-up time 150 µs Measured on the CC1101EM reference designs ([5] and [6])
using crystal AT-41CD2 from NDK.
This parameter is to a large degree crystal dependent.
Table 7: Crystal Oscillator Parameters