Operating instructions

THE NANOSURF EASYSCAN 2 AFM
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damping of the cantilever vibration caused by the forces between the tip
and the cantilever can be measured and used for controlling the tip-sample
distance.
To achieve atomic resolution, ultra-clean and flat surfaces prepared in
highly sophisticated vacuum systems are needed. Nevertheless, measure-
ments in air can give useful results for many technically relevant surfaces.
In this manual, the use of the dynamic modes in air on such technically
relevant surfaces is described.
The Nanosurf easyScan 2 AFM
The easyScan 2 AFM is an AFM that can be used in both static and
dynamic operating modes. The AFM cantilever is a micro fabricated canti-
lever with an integrated tip mounted on a cantilever holder chip (see figure
Cantilever).
When the sensor tip comes in contact with the sample, a repulsive forcethat
increases with decreasing tip-sample distance acts on it. In the static force
operating mode, the bend of the cantilever, due to the force acting on its
tip, is measured using a laser beam deflection system.
easyScan 2 AFM system: Computer, Cantilever with deflection measurement system scanning the
sample.
Control
electronics