Operating instructions

The easyScan 2 AFM

The Nanosurf easyScan 2 AFM is an atomic force microscope system that

can make nanometer scale resolution measurements of topography and sev-

eral other properties of a sample. The easyScan 2 AFM system is a modular

scanning probe system that can be upgraded to obtain more measurement

capabilities. The main parts of the basic system are the easyScan 2 AFM

scan head, the AFM Sample stage, the easyScan 2 Controller with AFM

Basic module, and the easyScan 2 software. At the time of publication, the

following parts can be used with the easyScan 2 system:

• STM Scan Head: makes atomic scale measurements. Refer to the easy-

Scan 2 STM Operating Instructions for more details.

• AFM Dynamic Module: adds dynamic mode measurement capabilities

for measuring delicate samples.

• AFM Mode Extension Module: adds phase contrast, force modulation

and current measurement capabilities.

• AFM Video Module: allows observation of the approach on the compu-

ter screen. This is especially useful when observation using the lenses is

impractical.

• Signal Modules: allow monitoring signals (Module: S) and creating cus-

tom measurement modes (Module: A). Refer to chapter The Signal Mod-

ules (p.61) for more details.

• Micrometre Translation Stage: for reproducibly finding a specific posi-

tion on the sample.

• Nanosurf Report: software for detailed measurement analysis and auto-

matic report generation.

• Scripting Interface: software for automating measurements. Refer to the

Software Reference and Programmer’s Manual for more details.

• TS-150 active vibration isolation table: reduces the sensitivity of the

instrument to vibrations in its environment.