Specifications

G121SN01 V4 rev. 1.4
P
age 20/24
G
121SN01 V4
8. Reliability Test Criteria
Items
Required Condition Note
Temperature Humidity Bias
40
o
C, 90%RH, 300 hours
High Temperature Operation
85
o
C, 300 hours
Low Temperature Operation
-30
o
C, 300 hours
Hot Storage
85
o
C, 300 hours
Cold Storage
-30
o
C, 300 hours
Thermal Shock Test
-20
o
C / 30 min, 60
o
C / 30 min, 100cycles, 40
o
C minimun ramp rate
Hot Start Test
85
o
C / 1Hr min. power on/off per 5 minutes, 5 times
Cold Start Test
-30
o
C / 1Hr min. power on/off per 5 minutes, 5 times
Shock Test (Non-Operating)
50G, 20ms, Half-sine wave, ( ±X, ±Y, ±Z)
Vibration Test
(Non-Operating)
1.5G, (10~200Hz, Sine wave)
30 mins/axis, 3 direction (X, Y, Z)
On/off test
On/10 sec, Off/10 sec, 30,000 cycles
ESD
Contact Discharge: ± 8KV, 150pF(330Ω ) 1sec, 8 points, 25 times/ point
Air Discharge: ± 15KV, 150pF(330Ω ) 1sec, 8 points, 25 times/ point
Note 1
EMI
30-230 MHz, limit 40 dBu V/m, 230-1000 MHz, limit 47 dBu V/m
Note1: According to EN61000-4-2, ESD class B: Some performance degradation allowed. No data lost
Self-recoverable. No hardware failures.
Note2:
Water condensation is not allowed for each test items.
Each test is done by new TFT-LCD module. Don’t use the same TFT-LCD module repeatedly for reliability test.
The reliability test is performed only to examine the TFT-LCD module capability.
To inspect TFT-LCD module after reliability test, please store it at room temperature and room humidity for 24
hours at least in advance.
AUO Confidential For DATAMODUL Internal Use Only / 2012/10/24