Specifications

TPS1H100-Q1
www.ti.com SLVSCM2A –OCTOBER 2014–REVISED JANUARY 2014
Typical Application (continued)
Table 3.
Test Items Test Condition Test Cycles
Cold repetitive short circuit test – short pulse –40°C, 10-ms pulse, cool down 1M
Cold repetitive short circuit test – long pulse –40°C, 300-ms pulse, cool down 1M
Hot repetitive short circuit test 25°C, keeping short 1M
Different grade levels are specified according to the pass cycles. The TPS1H100 gets the certification of Grade A
level, 1 million times short to GND, which is the highest test standard in the market.
Table 4.
Grade Number of Cycles Lots/Samples Per Lot Number of Fails
A >1000000 3/10 0
B >300000 to 1000000 3/10 0
C >100000 to 300000 3/10 0
D >30000 to 100000 3/10 0
E >10000 to 30000 3/10 0
F >3000 to 10000 3/10 0
G >1000 to 3000 3/10 0
H 300 to 1000 3/10 0
O <300 3/10 0
9.2.2.3 EMC Transient Disturbances Test
Due to the severe electrical condition in the automotive, the immunity capacity against electrical transient
disturbances is required, especially for a high-side power switch, which is connected to the battery directly.
Detailed test requirements are in accordance with the ISO 7637-2:2011 and ISO 16750-2:2010. TPS1H100-Q1
part is tested and certificated by a third-party organization.
Table 5. ISO 7637-2:2011(E) in 12-V System
(1)(2)(3)(4)
Test Pulse Severity Level Minimum Burst Cycle/Pulse Function
Input
Test and vs Accordingly Pulse Number of Repetition Time Performance
Resistance
Item Duration (t
d
) Pulses or Test Status
(Ω)
Level Vs/V MIN MAX
Time Classification
1 III –112 2 ms 500 pulses 0.5 s e s 10 Status II
2a III 55 50 µs 500 pulses 0.2 s 5 s 2 Status II
2b IV 10 0.2 to 2 s 10 pulses 0.5 s 5 s 0 to 0.05 Status II
3a IV –220 0.1 µs 1h 90 ms 100 ms 50 Status II
3b IV 150 0.1 µs 1h 90 ms 100 ms 50 Status II
(1) Tested both under input low condition and high condition.
(2) Considering the worst test condition, it is tested without any filter capacitors in V
S
and V
OUT
.
(3) GND pin network is a 1-kΩ resistor in parallel with a diode BAS21-7-F.
(4) Status II: The function does not perform as designed during the test, but returns automatically to normal operation after the test.
Table 6. ISO 16750-2:2010(E) Load Dump Test B in 12-V System
(1)(2)(3)(4)(5)
Test Pulse Severity Level Minimum Burst Cycle/Pulse Function
Input
Test and vs Accordingly Pulse Number of Repetition Time Performance
Resistance
Item Duration (t
d
) Pulses or Test Status
(Ω)
Level Vs/V MIN (s) MAX (s)
Time Classification
Test B 45 40 to 400 ms 5 pulses 60 e 0.5 to 4 Status II
(1) Tested both under input low condition and high condition.
(2) Considering the worst test condition, it is tested without any filter capacitors in V
S
and V
OUT
.
(3) GND pin network is a 1-kΩ resistor in parallel with a diode BAS21-7-F.
(4) Status II: The function does not perform as designed during the test, but returns automatically to normal operation after the test.
(5) Select 45-V external suppressor
Copyright © 2014, Texas Instruments Incorporated Submit Documentation Feedback 35
Product Folder Links: TPS1H100-Q1