Specifications

Ref. light
Mask
Mask
Mirror M3
Mirror M2
Mirror M1
Sample light
8°
90°
ø60
integrating
sphere
770
450
1070
600
465
580
External view
Optics
Sample
(measuring
surface down)
Light beam
24
Accessories
(Options)
ISR-2600 Integrating Sphere Attachment
(P/N 206-28400-41)
ISR-2600Plus Integrating Sphere Attachment (for UV-2600 only)
(P/N 206-28410-41)
By combining the 0°/8° incidence angle integrating sphere with the S/R
exchange function of the spectrophotometer, diffuse and specular reectance
measurements are possible without using any special attachments.
The size of the light beam for reectance measurements can be changed, which
enables reectance measurement of micro samples (minimum light beam
dimensions about 2 × 3 mm). Light beams for transmittance measurements can
be concentrated to dimensions of 3 × 3 mm.
The ISR-2600Plus is an integrating sphere equipped with two detectors: a
photomultiplier tube and an InGaAs detector.
ISR-2600/2600Plus specications
• Inner diameter of integrating sphere: 60 mm
• Maximum size of reectance sample: W95 × H135 × T20 mm (0° incidence side)
W70 × H70 × T12 mm (8° incidence side)
ISR-2600 specications
• Measurement wavelength range: 220 to 850 nm
• Noise level: 0.1 %T RMS 500 nm (UV-2600)
0.3 %T RMS 500 nm (UV-2700)
• 100 % atness: ± 0.5 %T (UV-2600)
± 1.5 %T (UV-2700)
• Near-infrared range stray light:
0.4 %T (1400 nm, H
2
O, 5mm slit, typical value)
ISR-2600Plus specications
• Measurement wavelength range: 220 to 1400 nm
• Noise level: 0.1 %T RMS 500 nm
0.3 %T RMS 900 nm
• 100 % atness: ± 0.5 %T (220 to 1300 nm)
MPC-2600 Multipurpose Sample Compartment
(P/N 206-28420-41)
The MPC-2600 enables both reectance and transmittance measurement of samples having a wide variety
of shapes. An integrating sphere is built-in to permit accurate measurement of solid samples. The sample
space around the integrating sphere is ample enough to allow measurement of very large samples.
• Measurement wavelength range: 240 to 800 nm
• Maximum sample size:
Transmittance: 305 mm dia. × 50 mm thick or 204 mm dia. × 300 mm thick
Reectance: 305 mm dia. × 50 mm thick
• With independent S/R beam switching, 0°/8° incidence angle reectance measurement
is possible without tilting the sample.
• With the integrating sphere shift function, the range of applications is expanded.
• V stage built in. The sample position can be adjusted vertically and laterally.
• Noise level: 0.1 %T RMS 500 nm (UV-2600)
0.3 %T RMS 500 nm (UV-2700)
• 100 % atness: 350 to 850 nm
± 0.5 %T (UV-2600)
± 1.5 %T (UV-2700)
Specular Reectance Measurement
Attachment (5° Incident Angle)
(P/N 206-14046)
The technique of specular reectance measurement is often applied to the
evaluation of semiconductors, optical materials, multiple layers, etc. relative to a
reference reecting surface. The 5° incident angle minimizes the inuence of
polarized light. Thus, no polarizer is required for measurement, making the
operation quite simple.
• Samples as large as W100 × D160 × T15 mm can be readily measured.
The minimum size is 7 mm in diameter.
• Sample placement is easy - just set it on a holder with the measuring surface down.