Datasheet

DEM 320240M TMH-PW-N Production Specification
Version: 1.1 PAGE: 15
10. RELIABILITY TEST CONDITIONS
No.
Test Item
Test Condition
Inspection after test
1 High Temperature Storage 80±2°C/240 hours Inspection after
2~4hours storage at
room temperature, the
sample shall be free
from defects:
1.Current changing
value before test and
after test is 50% larger；
2. function
defect:Non-display ,abn
ormal-display,missing
lines,Short lines，ITO
corossion；
3.visual defect:Air
bubble in the
LCD,Sealleak,Glass
crack。
2 Low Temperature Storage -30±2°C/240 hours
3 High Temperature Operating 70±2°C/120 hours
4 Low Temperature Operating -20±2°C/120 hours
5 Temperature Cycle
-20±2°C~25~70±2°C*10cycles
(30min.) (5min.) (30min.)
6 Damp Proof Test 50°C*90% RH/120 hours
7 Vibration Test
Frequency：10Hz~55Hz~10Hz
Amplitude：1.5mm, X，Y，Z direction for
total 3hours
(Packing condition)
8 Dropping test
Drop to the ground from 1m height, one
time, every side of carton. (Packing
condition)
9 ESD test
Voltage:±8KV R: 330Ω C: 150pF
Air discharge, 10time
Remark:
1.The test samples should be applied to only one test item.
2.Sample size for each test item is 3~5pcs.
3.For Damp Proof Test, Pure water(Resistance＞10MΩ) should be used.
4.In case of malfunction defect caused by ESD damage, if it would be recovered to normal state after
resetting, it would be judged as a good part.
5.EL evaluation should be excepted from reliability test with humidity and temperature: Some defects such
as black spot/blemish can happen by natural chemical reaction with humidity and Fluorescence EL has.
6.Failure Judgment Criterion: Basic Specification, Electrical Characteristic, Mechanical Characteristic,
Optical Characteristic.