User manual
Measurements
R&S
®
RTO
136User Manual 1316.0827.02 ─ 06
Meas. type Symbol Description/Result
t
Setup/Hold time T
Setup
and T
Hold
Setup and Hold time measurement with positive and/or negative
clock edge.
See: "Setup/Hold measurement settings" on page 164
t
Setup/Hold ratio
T
Setup
/
(T
Setup
+
T
Hold
)
Setup/Hold ratio measurement with positive and/or negative clock
edge.
See: "Setup/Hold measurement settings" on page 164
Area Measurements
Area mesurements are voltage over time measurements. They are provided in the
"Measurements" dialog box, "Setup > Amp/Time" tab.
Table 5-3: Area measurement types
Meas. type Symbol Description/Result
Area A
Ref
Area between the waveform and a reference level ("Area level",
X
Ref
).
Eval
N
i
Ref
Eval
Eval
Ref
Xix
N
T
A
1
)(
T
Eval
: Evaluation time, time of a full waveform or limited by a gate
Cycle area A
RefCyc
Area between the waveform and a reference level ("Area level")
measured for one period, see also "Area" measurement. The
measurement requires at least one complete period of a triggered
signal. Multiple measurement is possible.
Counting
Counting measurements are provided in the "Measurements" dialog box, "Setup > Amp/
Time" tab.
Table 5-4: Counting measurement types
Meas. type Symbol Description/Result
n
Pulse count
The number of positive or negatve pulses of the waveform, or
both. The mean value of the signal is determined. If the signal
passes the mean value, an edge is counted. A positive pulse is
counted if a rising edge and a following falling edge are detected.
A negative pulse is counted if a falling edge and a following rising
edge are detected.
n
Edge count
The number of positive or negative edges, or of both. The mean
value of the signal is determined. If the signal passes the mean
value, an edge is counted.
This measurement type is only available for digital channels
(requires MSO option R&S RTO-B1).
5.2.1.3 Eye/Jitter Measurements
The eye diagram is a significant means of visualizing jitter and allows you to analyze the
reasons for it. Characteristic values can be identified in the eye diagram, and by creating
histograms of the eye diagram, important jitter parameters can be determined.
Automatic Measurements