User's Manual

Table Of Contents
USB2.0 DEVICE S3C2450X RISC MICROPROCESSOR
17-12
8.6 TEST REGISTER (TR)
The test register is used for the diagnostics. All bit are activated when 1 is written to and is cleared by 0 on them.
Bit[3:0] are for the high speed device only.
Register Address R/W Description Reset Value
TR 0x4980_0018 R/W Test register 0x0
TR Bit R/W Description Initial State
[31:5]
Reserved
TMD [4] R/W Test Mode.
When TMD is set to 1. The core is forced into the test mode.
Following TPS, TKS, TJS, TSNS bits are meaningful in test
mode.
0
TPS [3] R/W Test Packets.
If this bit is set, the USB repetitively transmit the test
packets to Host.
The test packets are explained in 7.1.20 of USB 2.0
specification.
This bit can be set when TMD bit is set.
0
TKS [2] R/W Test K Select.
If this bit is set, the transceiver port enters into the high-
speed K state.
This bit can be set when TMD bit is set.
0
TJS [1] R/W Test J Select.
If this bit is set, the transceiver port enters into the high-
speed J state.
This bit can be set when TMD bit is set.
0
TSNS [0] R/W Test SE0 NAK Select
If this bit is set, the transceiver enters into the high speed
receive mode and must respond to any IN token with NAK
handshake.
This bit can be set when TMD bit is set.
0