Concept Guide

20 Memory Errors and Dell PowerEdge YX4X Server Memory RAS Features
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References
[1]
P. Restle, J. Park and B. Lloyd, "DRAM Variable Retention Time," IEEE, 1992.
[2]
K. Aadithya, A. Demir, S. Venugopalan and J. Roychowdhury, "Accurate Prediction of Random
Telegraph Noise Effects in SRAMs and DRAMs," IEEE, 2013.
[3]
"ReedSolomon error correction," Wikipedia, [Online]. Available:
https://en.wikipedia.org/wiki/Reed%E2%80%93Solomon_error_correction.
[4]
V. Sridharan and D. Liberty, "A study of DRAM failures in the field," IEEE, 2012.
[5]
A. Hwang, S. Ioan and B. Schroeder, "Cosmic rays don't strike twice: understanding the nature of
DRAM errors and the implications for system design," ACM, 2012.
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Dell, EMC and other trademarks are trademarks of Dell Inc. or its subsidiaries.
Other trademarks may be trademarks of their respective owners.