Release Notes

MTBF disclaimer
Disclaimer
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Limitations of reliability prediction models
Reliability prediction models provide MTBF point estimates. Model inputs include base component failure rates, environmental,
quality, and stress factors. Base failure rates use failure data from multiple sources, including industry field data, research lab
test results, and government labs.
Environmental, quality, and stress factors may differ from field conditions. Predictions assume a constant failure rate which does
not account for failures due to early life quality issues or wearout phenomena.
General prediction methodology
Dell uses the default prediction methodology, Telcordia SR332, Reliability Prediction Procedure for Electronic Equipment. Other
methods may be used to estimate the reliability of certain products and/or subsystems. System reliability predictions take into
account the impact of redundant components.
Component parameters and assumptions
The default methodology for MTBF predictions is Telcordia method 1, case 3. Assumptions include 25oC system inlet air
temperature, quality level II components, ground-based, fixed, controlled environment, and 100% duty cycle. Components
internal to the system are assumed to be operating at 40oC ambient and 50% electrical stress.
Dell does not provide MTBF data below the system level.
Supplier MTBF data
In developing system MTBF predictions, Dell uses subsystem MTBF data that is provided by suppliers.
Apart from the use of industry standard prediction methodologies, suppliers may derive MTBF data from reliability
demonstration testing, life testing, actual field failure rate, or specification/datasheets.
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24 MTBF disclaimer