Hardware manual

Impact Reference Guide How the Code Reader Tool Works
6-43 Datalogic Automation Inc.
Symbol Contrast (SC)
Minimum Reflectance (Rmin)
Minimum Edge Contrast (ECmin)
Modulation (MOD)
Defects
Decodability (V)
The Overall Symbol grade is calculated using the mean of the ten scan grades.
AIM DPM QUALITY GUIDELINE
The AIM DPM Quality Guideline is applicable to the symbol quality assessment of direct parts marking per-
formed in using two-dimensional bar code symbols. It defines modifications to the measurement and grad-
ing of several symbol quality parameters.
The marking processes covered by this guideline are as follows: Dot Peening, Ink Jet, Laser Etching and
Electrochemical Etching.
Each quality parameter is measured and a grade on a descending scale of integers from 4 to 0 is allocated to
it. The grade 4 (A) represents the highest quality, while the grade 0 (F) represents failure.
The Overall symbol grade is the lowest grade achieved for the following seven parameters:
Decode
Cell Contrast (CC)
Cell Modulation (CM)
Fixed Pattern Damage
Axial Non-Uniformity (ANU)
Grid Non-Uniformity (GNU)
Minimum Reflectance (MR)