Specifications

CY14B101P
Document Number: 001-44109 Rev. *O Page 25 of 36
AC Test Conditions
Input pulse levels ................................................... 0 V to 3 V
Input rise and fall times (10%–90%) ............................ <
3 ns
Input and output timing reference levels ....................... 1.5 V
Data Retention and Endurance
Over the Operating Range
Parameter Description Min Unit
DATA
R
Data retention 20 Years
NV
C
Nonvolatile STORE operations 1,000 K
Capacitance
Parameter
[12]
Description Test Conditions Max Unit
C
IN
Input capacitance T
A
= 25 C, f = 1 MHz,
V
CC
= V
CC
(Typ)
6pF
C
OUT
Output pin capacitance 8 pF
Thermal Resistance
Parameter
[12]
Description Test Conditions 16-pin SOIC Unit

JA
Thermal resistance
(junction to ambient)
Test conditions follow standard test methods
and procedures for measuring thermal
impedance, per EIA / JESD51.
55.17 C / W

JC
Thermal resistance
(junction to case)
2.64 C / W
AC Test Loads and Waveforms
Figure 24. AC Test Loads and Waveforms
3.0 V
OUTPUT
5 pF
R1
R2
789 
3.0 V
OUTPUT
30 pF
R1
R2
789 
577 
577 
Note
12. These parameters are guaranteed by design and are not tested.
Not Recommended for New Designs