Datasheet

CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Document Number: 001-00435 Rev. *R Page 32 of 35
Acronyms Document Conventions
Units of Measure
Acronym Description
BWS Byte Write Select
CMOS Complementary Metal Oxide Semiconductor
DDR Double Data Rate
DLL Delay Lock Loop
FBGA Fine-Pitch Ball Grid Array
HSTL High Speed Transceiver Logic
I/O Input/Output
PLL Phase-Locked Loop
QDR Quad Data Rate
SEL Single Event Latch-up
SRAM Static Random Access Memory
TCK Test Clock
TDI Test Data In
TDO Test Data Out
TMS Test Mode Select
Symbol Unit of Measure
°C degree Celsius
FIT/Dev failure in time/device
FIT/Mb failure in time/mega bit
µA microampere
µs microsecond
mA milliampere
ms millisecond
ns nanosecond
 ohm
pF picofarad
Vvolt
Wwatt