Datasheet
CY7C1525KV18
CY7C1512KV18
CY7C1514KV18
Document Number: 001-00436 Rev. *R Page 8 of 34
Functional Overview
The CY7C1525KV18, CY7C1512KV18, and CY7C1514KV18
are synchronous pipelined Burst SRAMs with a read port and a
write port. The read port is dedicated to read operations and the
write port is dedicated to write operations. Data flows into the
SRAM through the write port and flows out through the read port.
These devices multiplex the address inputs to minimize the
number of address pins required. By having separate read and
write ports, the QDR II completely eliminates the need to turn
around the data bus and avoids any possible data contention,
thereby simplifying system design. Each access consists of two
9-bit data transfers in the case of CY7C1525KV18, two 18-bit
data transfers in the case of CY7C1512KV18, and two 36-bit
data transfers in the case of CY7C1514KV18 in one clock cycle.
This device operates with a read latency of one and half cycles
when DOFF
pin is tied HIGH. When DOFF pin is set LOW or
connected to V
SS
then the device behaves in QDR I mode with
a read latency of one clock cycle.
Accesses for both ports are initiated on the rising edge of the
positive input clock (K). All synchronous input timing is refer-
enced from the rising edge of the input clocks (K and K
) and all
output timing is referenced to the output clocks (C and C
, or K
and K
when in single clock mode).
All synchronous data inputs (D
[x:0]
) pass through input registers
controlled by the input clocks (K and K
). All synchronous data
outputs (Q
[x:0]
) pass through output registers controlled by the
rising edge of the output clocks (C and C
, or K and K when in
single clock mode).
All synchronous control (RPS
, WPS, BWS
[x:0]
) inputs pass
through input registers controlled by the rising edge of the input
clocks (K and K).
CY7C1512KV18 is described in the following sections. The
same basic descriptions apply to CY7C1525KV18, and
CY7C1514KV18.
Read Operations
The CY7C1512KV18 is organized internally as two arrays of
2 M × 18. Accesses are completed in a burst of two sequential
18-bit data words. Read operations are initiated by asserting
RPS
active at the rising edge of the positive input clock (K). The
address is latched on the rising edge of the K clock. The address
presented to the address inputs is stored in the read address
register. Following the next K clock rise, the corresponding
lowest order 18-bit word of data is driven onto the Q
[17:0]
using
C
as the output timing reference. On the subsequent rising edge
of C, the next 18-bit data word is driven onto the Q
[17:0]
. The
requested data is valid 0.45 ns from the rising edge of the output
clock (C and C or K and K when in single clock mode).
Synchronous internal circuitry automatically tristates the outputs
following the next rising edge of the output clocks (C/C
). This
enables for a seamless transition between devices without the
insertion of wait states in a depth expanded memory.
ZQ Input Output impedance matching input. This input is used to tune the device outputs to the system data
bus impedance. CQ, CQ
, and Q
[x:0]
output impedance are set to 0.2 × RQ, where RQ is a resistor
connected between ZQ and ground. Alternatively, connect this pin directly to V
DDQ
, which enables the
minimum impedance mode. This pin cannot be connected directly to GND or left unconnected.
DOFF
Input PLL turn off Active LOW. Connecting this pin to ground turns off the PLL inside the device. The timing
in the operation with the PLL turned off differs from those listed in this data sheet. For normal operation,
connect this pin to a pull up through a 10 k or less pull up resistor. The device behaves in QDR I mode
when the PLL is turned off. In this mode, the device can be operated at a frequency of up to 167 MHz
with QDR I timing.
TDO Output Test data out (TDO) pin for JTAG.
TCK Input Test clock (TCK) pin for JTAG.
TDI Input Test data in (TDI) pin for JTAG.
TMS Input Test mode select (TMS) pin for JTAG.
NC N/A Not connected to the die. Can be tied to any voltage level.
NC/144M Input Not connected to the die. Can be tied to any voltage level.
NC/288M Input Not connected to the die. Can be tied to any voltage level.
V
REF
Input-
Reference
Reference voltage input. Static input used to set the reference level for HSTL inputs, outputs, and AC
measurement points.
V
DD
Power Supply Power supply inputs to the core of the device.
V
SS
Ground Ground for the device.
V
DDQ
Power Supply Power supply inputs for the outputs of the device.
Pin Definitions (continued)
Pin Name I/O Pin Description