Datasheet

CY7C1525KV18
CY7C1512KV18
CY7C1514KV18
Document Number: 001-00436 Rev. *R Page 31 of 34
Acronyms Document Conventions
Units of Measure
Acronym Description
DDR Double Data Rate
FBGA Fine-Pitch Ball Grid Array
HSTL High-Speed Transceiver Logic
I/O Input/Output
JEDEC Joint Electron Devices Engineering Council
JTAG Joint Test Action Group
LMBU Logical Multiple Bit Upset
LSB Least Significant Bit
LSBU Logical Single Bit Upset
MSB Most Significant Bit
PLL Phase-Locked Loop
QDR Quad Data Rate
SEL Single Event Latch-up
SRAM Static Random Access Memory
TAP Test Access Port
TCK Test Clock
TMS Test Mode Select
TDI Test Data-In
TDO Test Data-Out
TTL Transistor-Transistor Logic
Symbol Unit of Measure
°C degree Celsius
MHz megahertz
µA microampere
µs microsecond
mA milliampere
mm millimeter
ms millisecond
ns nanosecond
 ohm
% percent
pF picofarad
ps picosecond
Vvolt
Wwatt