Datasheet
Table Of Contents
- Features
- Configurations
- Functional Description
- Logic Block Diagram (CY7C14161KV18)
- Logic Block Diagram (CY7C14271KV18)
- Logic Block Diagram (CY7C14181KV18)
- Logic Block Diagram (CY7C14201KV18)
- Contents
- Pin Configuration
- Pin Definitions
- Functional Overview
- Application Example
- Truth Table
- Burst Address Table (CY7C14181KV18, CY7C14201KV18)
- Write Cycle Descriptions
- Write Cycle Descriptions
- Write Cycle Descriptions
- IEEE 1149.1 Serial Boundary Scan (JTAG)
- TAP Controller State Diagram
- TAP Controller Block Diagram
- TAP Electrical Characteristics
- TAP AC Switching Characteristics
- TAP Timing and Test Conditions
- Identification Register Definitions
- Scan Register Sizes
- Instruction Codes
- Boundary Scan Order
- Power Up Sequence in DDR II SRAM
- Maximum Ratings
- Operating Range
- Neutron Soft Error Immunity
- Electrical Characteristics
- Capacitance
- Thermal Resistance
- Switching Characteristics
- Switching Waveforms
- Ordering Information
- Package Diagram
- Document History Page
- Sales, Solutions, and Legal Information

CY7C14161KV18, CY7C14271KV18
CY7C14181KV18, CY7C14201KV18
Document Number: 001-58826 Rev. *D Page 26 of 30
Output Times
t
CO
t
CHQV
C/C Clock Rise (or K/K in single
clock mode) to Data Valid
– 0.45 – 0.45 – 0.45 – 0.45 – 0.50 ns
t
DOH
t
CHQX
Data Output Hold after Output C/C
Clock Rise (Active to Active)
–0.45 – –0.45 – –0.45 – –0.45 – –0.50 – ns
t
CCQO
t
CHCQV
C/C Clock Rise to Echo Clock Valid – 0.45 – 0.45 – 0.45 – 0.45 – 0.50 ns
t
CQOH
t
CHCQX
Echo Clock Hold after C/C Clock
Rise
–0.45 – –0.45 – –0.45 – –0.45 – –0.50 – ns
t
CQD
t
CQHQV
Echo Clock High to Data Valid – 0.25 – 0.27 – 0.30 – 0.35 – 0.40 ns
t
CQDOH
t
CQHQX
Echo Clock High to Data Invalid –0.25 – –0.27 – –0.30 – –0.35 – –0.40 – ns
t
CQH
t
CQHCQL
Output Clock (CQ/CQ) HIGH
[23]
1.25–1.40–1.75–2.25–2.75– ns
t
CQHCQH
t
CQHCQH
CQ Clock Rise to CQ Clock Rise
(rising edge to rising edge)
[23]
1.25–1.40–1.75–2.25–2.75– ns
t
CHZ
t
CHQZ
Clock (C/C) Rise to High-Z
(Active to High-Z)
[24, 25]
– 0.45 – 0.45 – 0.45 – 0.45 – 0.50 ns
t
CLZ
t
CHQX1
Clock (C/C) Rise to Low-Z
[24, 25]
–0.45 – –0.45 – –0.45 – –0.45 – –0.50 – ns
PLL Timing
t
KC Var
t
KC Var
Clock Phase Jitter – 0.20 – 0.20 – 0.20 – 0.20 – 0.20 ns
t
KC lock
t
KC lock
PLL Lock Time (K, C) 20–20–20–20–20– μs
t
KC Reset
t
KC Reset
K Static to PLL Reset 30–30–30–30–30– ns
Switching Characteristics (continued)
Over the Operating Range
[20, 21]
Cypress
Parameter
Consortium
Parameter
Description
333 MHz 300 MHz 250 MHz 200 MHz 167 MHz
Unit
Min Max Min Max Min Max Min Max Min Max
Notes
23. These parameters are extrapolated from the input timing parameters (t
CYC
/2
- 250 ps, where 250 ps is the internal jitter). These parameters are only guaranteed by
design and are not tested in production.
24. t
CHZ
, t
CLZ
are specified with a load capacitance of 5 pF as in (b) of AC Test Loads and Waveforms. Transition is measured ±100 mV from steady-state voltage.
25. At any voltage and temperature t
CHZ
is less than t
CLZ
and t
CHZ
less than t
CO
.
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