Technical data

6-48 Interactive Diagnostics Environment (IDE)
mem6 Walking ones and zeros memory
test (slow; 40 minutes/32 MB)
Another traditional test –
walking ones and walking
zeros through memory. This is
a whole-memory test that is
very good at shaking out
shorted data bits, but
provides little protection for
addressing errors.
mem7 March X (4 minutes/128 MB) Described in van de Goor’s
book, Testing Semiconductor
Memories and has the
following flow:
(w0), u(r0,w1), d(r1,w0), (r0)
Will detect address decoder
faults, stuck-at-faults,
transition faults, coupling
faults, and inversion coupling
faults (see van de Goor for
definitions).
mem8 March Y (4 minutes/128 MB) Described in van de Goor’s
book, Testing Semiconductor
Memories and has the
following flow:
(w0), u(r0,w1,r1), d(r1,w0,r0), (r0)
Will detect address decoder
faults, stuck-at-faults,
transition faults, coupling
faults, and linked transition
faults (see van de Goor for
definitions).
Test Function Description
Table 6-10 (continued) MC3 Tests