Technical data

6-28 Interactive Diagnostics Environment (IDE)
cache17 (d_kh) - Primary Data RAM Knaizuk Hartmann Test
This tests the data integrity of the D-cache with the Knaizuk Hartmann algorithm. Data
pattern 0x55555555 and 0xaaaaaaaa are used.
Possible errors:
0107027: Partition 1 error after partition 0 set to 0xaaaaaaaa
0107028: Partition 2 error after partition 1 set to 0xaaaaaaaa
0107029: Partition 0 error after partition 1 set to 0xaaaaaaaa
010702a: Partition 1 error after partition 1 set to 0xaaaaaaaa
010702b: Partition 0 error after partition 0 set to 0x55555555
010702c: Partition 2 error after partition 2 set to 0xaaaaaaaa
For each of the above errors, the following additional information is provided:
Cache address: 0x%08x
Expected: 0x%08x Actual: 0x%08x Xor: 0x%08x
cache18 (dsd_wlk) - Primary/Secondary Data Path Test
Tests the data path from memory through the secondary cache and to the primary data
cache.
Possible errors:
010702d: Data Path Error from Memory->Secondary->Primary Data
Address %x, expected %x, actual %x, Xor %x
010702e: Data Path Error from Primary ->Secondary->Memory Data
Address %x, Expected %x, Actual %x, Xor %x
cache19 (sd_aina) - Secondary Data RAM (Address in Address) Test
Performs an “address in address” test on the secondary data cache.
Possible errors:
010502f: Secondary Memory Error on pattern 1
Address %08x
expected %08x, actual %08x, XOR %08x
0105030: Secondary Memory Error on pattern 2
Address %08x
expected %08x, actual %08x, XOR %08x