Technical data

CHALLENGE/Onyx Diagnostic Road Map 6-25
cache8 (PiTagKh) - Primary Instruction TAG RAM Knaizuk Hartmann Test
This tests the data integrity of the primary instruction cache TAG RAM with the Knaizuk
Hartmann algorithm. It treats the TAG RAM array as a ordinary memory array. The parity
bit is not checked in this test.
Possible errors:
010400f: Partition 1 error after partition 0 set to 0xaaaaaaaa
0104010: Partition 2 error after partition 1 set to 0xaaaaaaaa
0104011: Partition 0 error after partition 1 set to 0xaaaaaaaa
0104012: Partition 1 error after partition 1 set to 0xaaaaaaaa
0104013: Partition 0 error after partition 0 set to 0x55555555
0104014: Partition 2 error after partition 2 set to 0xaaaaaaaa
For each of the above errors, the following additional information is provided:
Tag ram index address: 0x%08x
Expected: 0x%08x Actual: 0x%08x Xor: 0x%08x
cache9 (sd_tagwlk) - Secondary TAG Data Path Test
This checks the data integrity of the secondary data TAG RAM path using a walking-ones
or walking-zeros pattern.
Possible error:
0105015: Secondary Data TAG RAM Path Error
on sliding one (or zero) pattern
TAG RAM Location 0x%x
Expected 0x%x Actual= 0x%x XOR= 0x%x
cache10 (sd_tagaddr) - Secondary TAG Address Test
This checks the address integrity to the primary data TAG RAM by using a walking
address.
Possible error:
0105016: Secondary Data TAG Address Error
TAG RAM Location 0x%x
Expected 0x%x Actual= 0x%x XOR= 0x%x
cache11 (sd_tagkh) - Secondary TAG RAM Knaizuk Hartmann Test
This tests the data integrity of the secondary data cache TAG RAM with the Knaizuk
Hartmann algorithm. It treats the TAG RAM array as a ordinary memory array. The parity
bit is not checked in this test.
Possible error:
0105017: Secondary Data TAG ram data Error
Address %x, error code %d
expected %x, actual %x, XOR %x