Specifications

Data Sheet
Discover Fast waveform capture rate - over 250,000 wfm/s - maximizes the probability
of capturing elusive glitches and other infrequent events.
Feature-rich Tools for Debugging Mixed
Signal Designs
With the MSO/DPO5000 Mixed Signal Oscilloscope Series, you can
analyze up to 20 analog and digital signals with a single instrument to
quickly nd a
nd diag nose problems in complex designs. Bandwidths up to
2 GHz and sample rates up to 10 GS/s ensure yo u have the performance
you need to see fa st-changing signal details. To capture long windows of
signal a c tivity while maintaining ne timing resolution, the MSO/DPO5000
Series offers a deep record length of up to 12.5M points standard on
all channels and an optional record length of up to 250M points on two
channels.
With Wave Inspector
®
controls for rapid waveform navigation, and more
than 10 option al softwa re and analysis packages for common technologies
and in-d epth an
alysis tasks, the MSO/DPO5000 Series from Tektronix
provides the fe ature -rich tools you need t o simplify and speed debu g of
your complex design.
Comprehensiv
e Features Speed Every Stage
of Debug
The MSO/DPO5000 Series offers a robust set of features to speed eve ry
stage o f debug
ging your design from quickly discovering an anomaly and
capturing it, to searching your waveform re cord for the event and analyzing
its characteristics and your device's behavior.
Discover
To debug a de sign problem, rst you must know it exists. Every
design engineer spends time looking for problems in their design, a
time-consuming and frustrating task without the right debug tools.
The MSO/DPO50 00 Series offers the industry's most complete visualization
of signals, providing fast insight into th e real operation of your device.
Tektronix proprietary FastAcq™ te chnology delivers a f ast waveform
capture greater than 250,000 waveforms per second that enables you to
see glitche
s and other infrequent tra nsients within seconds, revealing th e
true nature of device faults. A digital phosphor display with color intensity
grading shows the history o f a signal's activity by using color to identify
areas of the signal that occur more frequently, providing a visual display
of just how often anomalies occur.
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