Specifications

6
External Inspection
External inspection of ICs can be completed with a single Sensor. The position
offset of the entire pallet before inspection can be adjusted on the image itself,
which reduces the amount of work required to increase mechanical positioning
accuracy.
You can combine multiple inspection items to perform external inspections, positioning, and other tasks all from a single Sensor.
Measurement Flow Purpose
Compensates for the position
offset of the chip.
Chip position
offset
o
n
lf,
Me
as
ur
em
en
t
Fl
ow
ng
Image Filters
Position compensation
Easily Perform Both Inspection and Positioning
Component Positioning
The Sensor can measure angles of rotation and other position information, so
it can also be used for positioning. Inspections can also be performed for the
number and size of holes along with the position information.
r
t
he
Adjusts the image so that
it is easier to inspect
Com
p
e
n
o
ffset
o
Position compensation
P
iti
t
i
Inspections
Calculations and Outputs
Calculation
Data Output
Individual Judgement Output
Measurement Flow
number
and
size
of
holes
along
wit
M
easurement Flo
w
Image Filters
Adjusts the image so that
it is easier to inspect
Image Filters
I
Fil
t
A
d
j
usts
t
it is easi
e
Inspections and Measurements
Calculations and Outputs
Calculation
Data Output
Calculates data for external output.
Outputs the position information and incline.
Purpose
Extended Functions
Width
measurements
Foreign matter
Number of pins
Pitch
inspections
Incomplete
characters
Edge Count
Sensitive Search
Color Data
Edge Position
Number of pins and pitch
inspections
Incomplete characters
Foreign matter
Width measurements
Uses the inspection data for
calculations and judgements.
Outputs the measurement
values.
Outputs the judgements of
inspections to individually.
Shape Search II
Labeling
Component incline and position
Number of holes and hole sizes
Number and Sizes of Holes
Inclination