Specifications

Diagnostics
5-7
Compaq Confidential – Need to Know Required
Writer: Hilary Stead Project: Compaq StorageWorks SAN Switch 16 Installation and Hardware Guide Comments:
Part Number: EK-BCP28-IA / 161356-001 File Name: F-CH5 DIAGNOSTICS.DOC Last Saved On: 9/30/99 11:30 AM
Spin Silk Test
To verify the intended functional operation of the switch, press <Enter> while
Spin Silk Test displays on the front panel. Each port’s transmitter sends frames
by means of the GBIC module and external cable, to another port’s receiver at
full hardware speed (1 GB/s). The entire path of the switch is exercised. Since
the processor does not compare data on each frame, the Spin Silk test does not
report the DIAG-DATA error. Other error messages defined for the Cross Port
test and the corresponding probable causes and actions are applicable to the
Spin Silk test.
NOTE:
When running the Spin Silk test, set the operating mode value to 0 or 1.
Related error messages are DIAG-INIT, DIAG-PORTDIED, DIAG-XMIT,
DIAG-PORTSTOPPED, DIAG-ERRSTAT, DIAG-ERRSTATS, and
DIAG-PORTABSENT.
SRAM Data Retention Test
To verify that data written into the ASIC memories is retained, press <Enter>
while
SRAM Data Retention Test displays on the front panel. Related error
messages are DIAG-REGERR, DIAG-REGERR_UNRST, and
DIAG-BUS_TIMEOUT.
CMEM Data Retention Test
To verify that the data written into the SRAMs that make up the central
memory is retained, press <Enter> while
CMEM Data Retention Test displays on
the front panel. Related error messages are DIAG-LCMEM, DIAG-LCMRS,
and DIAG-LCMTO.
Display Test
To verify that the front panel display is functioning properly, press <Enter>
while
Display Test displays on the front panel.
Display Test (long)
To execute a long version of the Display Test, press <Enter> while Display Test
(long)
displays on the front panel.