Specifications

Diagnostics
5-5
Compaq Confidential – Need to Know Required
Writer: Hilary Stead Project: Compaq StorageWorks SAN Switch 16 Installation and Hardware Guide Comments:
Part Number: EK-BCP28-IA / 161356-001 File Name: F-CH5 DIAGNOSTICS.DOC Last Saved On: 9/30/99 11:30 AM
Port Register Test
To test the switch’s application specific integrated circuit (ASIC) registers,
press <Enter> while
Port Register Test displays on the front panel. Ports 0 to 15
are tested. Related error messages are DIAG-REGERR,
DIAG-REGERR_UNRST, and DIAG-BUS_TIMEOUT.
Central Memory Test
To test the central memory in each ASIC, press <Enter> while Central Memory Test
displays on the front panel. This test ensures that:
■ The built-in self-repair (BISR) circuit in each ASIC chip does not report
failure to repair bad cells (bisr test).
■ The data cells can be uniquely written and read correctly
(data write/read test).
■ The data in any one ASIC can be read from any other ASIC
(asic-asic test).
■ Bad parity can be detected and flagged in the error register and an
interrupt can be posted (parity error test).
■ Buffer number error can be detected and flagged in the error register and
an interrupt can be posted (buffer number error test).
■ Chip number error can be detected and flagged in the error register and
an interrupt can be posted (chip number error test).
Related error messages are DIAG-CMBISTRO, DIAG-CMBISRF,
DIAG-LCMTO, DIAG-LCMRS, DIAG-LCMEM, DIAG-LCMEMTX,
DIAG-CMNOBUF, DIAG-CMERRTYPE, DIAG-CMERRPTN,
DIAG-PORTABSENT, DIAG-BADINIT, and DIAG-TIMEOUT.
CMI Conn Test
To verify that control messages can be correctly sent from any ASIC to any
ASIC, press <Enter> while
CMI Conn Test displays on the front panel. Related
error messages are DIAG-BADINIT, DIAG-INTNIL, DIAG-CMISA1,
DIAG-CMINOCAP, DIAG-CMIINVCAP, DIAG-CMIDATA, and
DIAG-CMICKSUM.