Product Info

MORL
A
11.
S
11.1.
G
Probe bou
than half
a
distance
m
and the hi
g
the phant
o
verified by
the refere
n
A
B
Shenzh
e
FL1-3,
B
Block6
7
S
AR T
e
G
eneral
ndary effe
c
a
probe tip
d
m
ust satisfy
g
her fields
c
o
m surface
f
the test la
b
n
ce distribu
t
e
n Morlab Communi
c
B
uilding A, FeiYang
S
7
, BaoAn District, Sh
e
e
st P
r
Scan
R
c
t error com
d
iameter to
measurem
e
c
losest to t
h
f
or computi
b
oratory for
t
ion functio
n
c
ations Technology
C
S
cience Park, No.8
L
e
nZhen , GuangDon
g
r
oced
u
R
equire
m
pensation i
s
the phanto
m
e
nt protoco
h
e phanto
m
ng 1-g SA
R
the scan r
e
n
s specifie
d
C
o., Ltd.
L
ongChang Road,
g
Province, P. R. Chi
u
re
m
ents
s
required
f
m
surface.
B
ls; to ensu
r
m
surface c
a
R
. Toleranc
e
e
solutions
u
d
in IEEE S
t
na
Tel:
8
Http:
/
R
E
f
or measur
e
B
oth the pr
o
r
e probe bo
u
a
n be corre
c
e
s o
f
the po
u
sed in the
S
t
d. 1528-2
0
8
6-755-36698555
/
/www.morlab.cn
E
PORT N
o
e
ments wit
h
o
be tip dia
m
u
ndary effe
c
tly measur
e
st-processi
S
AR meas
u
0
13.
Fax: [phone]
9
E-mail: service@
m
o
.：SZ21
0
h
the probe
m
eter and s
ct errors ar
e
e
d and ext
r
ng algorith
m
u
rements,
a
9
8525
m
orlab.cn
0
70039S0
2
Page 30 of 5
3
tip closer
ensor offs
e
e
minimize
d
r
apolated t
o
m
s must be
a
ccording t
o
2
3
e
t
d
o
o