Specifications

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Cisco ONS 15454 Installation and Operations Guide, R3.2
March 2002
Chapter 8 Performance Monitoring
Performance Monitoring for Electrical Cards
Table 8-28 Near-End VT PMs for the DS3XM-6 Card
Parameter Definition
CV-V
Code Violation VT Layer (CV-V) is a count of the BIP errors detected at
the VT path layer. Up to two BIP errors can be detected per VT
superframe; each error increments the current CV-V second register.
ES-V
Errored Seconds VT Layer (ES-V) is a count of the seconds when at least
one VT Path BIP error was detected. An AIS-V defect (or a lower-layer,
traffic-related, near-end defect) or an LOP-V defect can also cause ES-V.
SES-V
Severely Errored Seconds VT Layer (SES-V) is a count of seconds when
K (600) or more VT Path BIP errors were detected. An AIS-V defect (or
a lower-layer, traffic-related, near-end defect) or an LOP-V defect can
also cause SES-V.
UAS-V
Unavailable Seconds VT Layer (UAS-V) is a count of the seconds when
the VT path was unavailable. A VT path becomes unavailable when ten
consecutive seconds occur that qualify as SES-Vs and continues to be
unavailable until ten consecutive seconds occur that do not qualify as
SES-Vs.
Table 8-29 Near-End SONET Path PMs for the DS3XM-6 Card
Parameter Definition
STS CV-P
Near-End STS Path Coding Violations (CV-P) is a count of BIP errors
detected at the STS path layer (i.e., using the B3 byte). Up to eight BIP
errors can be detected per frame; each error increments the current CV-P
second register.
STS ES-P
Near-End STS Path Errored Seconds (ES-P) is a count of the seconds
when at least one STS path BIP error was detected. An AIS-P defect (or a
lower-layer, traffic-related, near-end defect) or an LOP-P defect can also
cause an STS ES-P.
STS FC-P
Near-End STS Path Failure Counts (FC-P) is a count of the number of
near-end STS path failure events. A failure event begins when an AIS-P
failure, an LOP-P failure, a UNEQ-P, or a TIM-P failure is declared. A
failure event also begins if the STS PTE that is monitoring the path
supports ERDI-P for that path. The failure event ends when these failures
are cleared.
STS SES-P
Near-End STS Path Severely Errored Seconds (SES-P) is a count of the
seconds when K (2400) or more STS path BIP errors were detected. An
AIS-P defect (or a lower-layer, traffic-related, near-end defect) or an
LOP-P defect can also cause an STS SES-P.
STS UAS-P
Near-End STS Path Unavailable Seconds (UAS-P) is a count of the
seconds when the STS path was unavailable. An STS path becomes
unavailable when ten consecutive seconds occur that qualify as SES-Ps,
and it continues to be unavailable until ten consecutive seconds occur that
do not qualify as SES-Ps.