User guide

CS5376A
8 DS612F4
• Digital offset correction and calibration.
- Individual channel offset correction to re-
move measurement offsets.
- Calibration engine for automatic calcula-
tion of offset correction factors.
1.2 Integrated Peripheral Features
• Synchronous operation for simultaneous sam-
pling in multi-sensor systems.
- MCLK / MSYNC output signals to syn-
chronize external components.
• High speed serial data output port (SD port).
- Asynchronous operation to 4 MHz for di-
rect connection to system telemetry.
- Internal 8-deep data FIFO for flexible out-
put timing.
• Digital test bit stream signal generator suitable
for CS4373A ∆Σ test DAC.
- Sine wave output mode for testing total har-
monic distortion.
- Programmable waveform data for custom
test signal generation.
• Time break controller to record system timing
information.
- Dedicated TB status bit in the output data
stream.
- Programmable output delay to match sys-
tem group delay.
• Additional hardware peripherals simplify sys-
tem design.
- 12 General Purpose I/O (GPIO) pins for lo-
cal hardware control.
- Secondary SPI 2 serial port to control local
serial peripherals.
- JTAG port for boundary scan (IEEE 1149.1
compliant).
1.3 System Level Features
• Flexible configuration options.
- Configuration 'on-the-fly' via microcontrol-
ler or system telemetry.
- Fixed configuration via stand-alone boot
EEPROM.
• Low power consumption.
Figure 2. Digital Filtering Stages
Sinc Filter
2 - 64000
FIR1
4
FIR2
2
IIR1 IIR2
1
st
Order
2
nd
Order
Output to High Speed Serial Data Port
DC Offset
Corrections
Output Word Rate from 4000 SPS ~ 1 SPS
Gain &
Modulator
512 kHz
Input