User Manual
Table Of Contents
- Features
- Table of Contents
- List of Figures
- 1. Hardware
- 2. Software
- 2.1 Installation Procedure
- 2.2 Using the Software
- 2.3 Start-up Window
- 2.4 Connect Menu
- 2.5 System Menu
- 2.5.1 Setup Window
- 2.5.1.1 Refresh Screen Button
- 2.5.1.2 Reset DUT Button
- 2.5.1.3 Save Config and Load Config Buttons
- 2.5.1.4 CS5480 MCLK Frequency
- 2.5.1.5 Configuration Registers
- 2.5.1.6 Pulse Control Register
- 2.5.1.7 Pulse Width and Pulse Rate Registers
- 2.5.1.8 Phase Compensation
- 2.5.1.9 Integrator Gain, System Gain
- 2.5.1.10 Sample Count, Cycle Count, Settle Time
- 2.5.1.11 Epsilon
- 2.5.1.12 ZXNUM
- 2.5.1.13 Mask Register
- 2.5.1.14 Temperature Registers
- 2.5.1.15 Zero-crossing Level and No Load Threshold
- 2.5.1.16 V1/V2 Sag, V1/ V2 Swell, and I1/I2 Overcurrent Registers
- 2.5.1.17 Channel Selection Level, Channel Select Minimum Amplitude, and Voltage Fixed RMS Reference Registers
- 2.5.1.18 Register Checksum, SerialCtrl Registers
- 2.5.1 Setup Window
- 2.6 Calibration Window
- 2.7 Conversion Window
- 2.8 Cirrus Test Window
- 2.8.1 Data Collection Window
- 2.8.1.1 Time Domain / FFT/ Histogram Selector
- 2.8.1.2 Config Button
- 2.8.1.3 Collect Button
- 2.8.1.4 Output Button
- 2.8.1.5 Zoom Button
- 2.8.1.6 Channel Select Button
- 2.8.1.7 Output Button & Window
- 2.8.1.8 Configuration Window
- 2.8.1.9 Collecting Data Sets
- 2.8.1.10 Analyzing Data
- 2.8.1.11 Histogram Information
- 2.8.1.12 Frequency Domain Information
- 2.8.1.13 Time Domain Information
- 2.8.2 Data Collection to File Window
- 2.8.3 Setup and Test Window
- 2.8.1 Data Collection Window
- Appendix A. Bill Of Materials
- Appendix B. Schematics
- Appendix C. Layer Plots
CDB5480U
DS893DB5 29
2.8 Cirrus Test Window
The Cirrus Test window provides three options: Test and Debug, ADC Data Collection, and ADC Data
Collection to File. Each window provides a means to evaluate the different functions and performance of
the CS5480. See Figure 22.
Figure 22. Cirrus Test Pull-down Options
2.8.1 Data Collection Window
The Data Collection window allows the user to collect sample sets of data from the CS5480 and analyze
them using time domain, FFT, and histogram plots. The Data Collection window can be accessed by
pulling down the CirrusTest menu, and selecting the ADC Data Collection item. See Figure 23.
Figure 23. Data Collection Window