Installation guide

EPROM Checksum Test
To ensure that the correct EPROMs are fitted, and also that they have been
programmed correctly, an auto-sizing, Add and XOR checksum test is
performed.
Action/Possible faults
Check that the correct EPROMs are fitted, and are in the correct
positions and orientation.
Check for bent pins on all IC legs on the EPROMs.
Application PROM Test
To ensure that the correct application EPROMs are fitted, an ADD and
XOR checksum test is performed. In addition a blank or missing device is
also checked for.
Action/Possible faults
Check that the Application EPROMs are actually fitted.
Check that they are the correct EPROMS, in the correct locations, and
in the correct orientation.
Check that there are no bent pins.
DRAM Test
A simple read/write access test to every location in the DRAM is
performed. The data 55AA is written to each location, read back and
compared. This is then repeated with the data inverted. This process is
repeated for every location. After each location has been tested, its address
is written and a check is performed to ensure that each location is unique.
Action/Possible faults
Faulty DRAM or associated circuitry.
BRAM Test
A simple, non-destructive read/write test of every location in the BRAM is
performed. A test pattern of 55AA is written to each location and then
X870-300451 Issue 2 2-8 Rev.0