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ManualsBrandsCalifornia Instruments ManualsAC Power Distribution1251RP Series
21222324252627282930
User Manual Compliance Test System 3.0
2.10 IEC 61000-4-17 DC Ripple
The IEC 61000-4-17 is aimed at testing a DC powered product for immunity against voltage
ripple. Ripple is often caused by feed-through from the AC input section of a DC supply and
exhibits itself as a small AC signal riding on the DC output. The IEC 61000-4-17 standards
covers test levels and frequencies for testing the immunity of DC products against such
phenomena.
The CTS system supports full compliance IEC 61000-4-17 testing (iX Series based CTS systems
only). The IEC 61000-4-17 test is implemented in the CIGUI32 or CIGuiSII Windows
®
software.
To accommodate changes in the specification, test levels and duration can be changed by the
operator or loaded from disk if needed. Non iX Series based CTS systems do not offer this test.
2.11 IEC 61000-4-27p Three Phase Voltage Unbalance
Three phase CTS systems support pre-compliance IEC 61000-4-27 testing. The IEC 61000-4-27
test is implemented in the CIGUI32 OR CIGUISII Windows
®
software. To accommodate changes
in the specification, test levels and duration can be changed by the operator or loaded from disk if
needed.
2.12 IEC 61000-4-28 Voltage Frequency Variations
The CTS system supports full compliance IEC 61000-4-28 testing (iX Series based CTS systems
only). The IEC 61000-4-28 test is implemented in the CIGui32 OR CIGuiSII Windows
®
software.
To accommodate changes in the specification, test levels and duration can be changed by the
operator or loaded from disk if needed. Non iX Series based CTS systems offer pre-compliance
testing of IEC 61000-4-28 only.
2.13 IEC 61000-4-29p DC Voltage Dips, Interruptions and Variations
The CTS system supports pre-compliance IEC 61000-4-29 testing (iX Series based CTS systems
only). The IEC 61000-4-29 test is implemented in the CIGui32 or CIGuiSII Windows
®
software.
To accommodate changes in the specification, test levels and duration can be changed by the
operator or loaded from disk if needed. Non iX Series based CTS systems do not support testing
to IEC 61000-4-29.
California Instruments Revision N 27