Datasheet

STM32F103xx Electrical characteristics
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5.3.4 Embedded reference voltage
The parameters given in Tabl e 1 0 are derived from tests performed under ambient
temperature and V
DD
supply voltage conditions summarized in Tabl e 7.
5.3.5 Supply current characteristics
The current consumption is measured as described in Figure 12: Current consumption
measurement scheme.
Maximum current consumption
The MCU is placed under the following conditions:
● All I/O pins are in input mode with a static value at V
DD
or V
SS
(no load)
● All peripherals are disabled except when explicitly mentioned
● The Flash memory access time is adjusted to the f
HCLK
frequency (0 wait state from 0
to 24 MHz, 1 wait state from 24 to 48 MHz and 2 wait states above)
● Prefetch in ON (reminder: this bit must be set before clock setting and bus prescaling)
● When the peripherals are enabled f
PCLK1
= f
HCLK
/2, f
PCLK2
= f
HCLK
The parameters given in Tabl e 1 1, Tabl e 1 2 and Tabl e 13 are derived from tests performed
under ambient temperature and V
DD
supply voltage conditions summarized in Tabl e 7.
Table 10. Embedded internal reference voltage
Symbol Parameter Conditions Min
Typ
Max Unit
V
REFINT
Internal reference voltage
−40 °C < T
A
< +105 °C 1.16 1.20 1.26 V
−40 °C < T
A
< +85 °C 1.16 1.20 1.24 V
T
S_vrefint
(1)
1. Shortest sampling time can be determined in the application by multiple iterations.
ADC sampling time when
reading the internal reference
voltage
5.1 17.1 µs