Specifications

Fabric OS Commands
88 Fabric OS Version 3.1.x/4.1.x Reference Guide
The test consists of 6 subtests:
Subtest 1
The BISR subtest executes the Built-In-Self-Repair (BISR) circuitry in each
ASIC. The BISR executes its own BIST, and cells found bad are replaced by
redundant rows provided in each SRAM in the ASIC. Once replaced, the BIST is
executed again.
The firmware merely sets up the hardware for the BISR/BIST operation and
checks the results. If the done bit in each SRAM is not set within a time-out
period, it reports the DIAG-CMBISRTO. If any of the SRAMs within the ASIC
fails to map out the bad rows, its fail bit is set and the DIAG-CMBISRF error
generated.
For V4.1.x, the firmware merely sets up the hardware for the BISR/BIST
operation and checks the results. If the done bit in each SRAM is not set within a
time-out period, it reports the DIAG-CMBISRTO.
If any of the SRAMs within the ASIC fails to map out the bad rows, its fail bit is
set and the DIAG-CMBISRF error is generated.
Subtest 2
The data write/read subtest executes the address and data bus verifications by
running a specified unique ramp pattern D to all SRAMs in all ASICs in the
switch. When all SRAMs are written with pattern D, the SRAMs are read and
compared against the data previously written. The above step is repeated with the
complemented pattern ~D to ensure that each data bit is toggled during the test.
For V3.1.x, the default pattern used (by POST also) is a QUAD_RAMP with a
seed value randomly obtained by reading the current content of the cpu timer
counter.
For example, the pattern D could take the form of:
ASIC #1: 0x41176, 0x41177, 0x41178, 0x41179, ...
ASIC #2: 0x51ef6, 0x51ef7, 0x51ef8, 0x51ef9, ...
ASIC #3: 0x62c76, 0x62c77, 0x62c78, 0x62c79, ...
ASIC #4: 0x739f6, 0x739f7, 0x739f8, 0x739f9, ...
The complemented pattern ~D would then be:
ASIC #1: 0xfffbee89, 0xfffbee88, 0xfffbee87, ...
ASIC #2: 0xfffae109, 0xfffae108, 0xfffae107, ...