Specifications

Fabric OS Commands
784 Fabric OS Version 3.1.x/4.1.x Reference Guide
Data retention test of the miscellaneous SRAMs in ASIC.
Synopsis: V3.1.x
sramRetentionTest [passCount]
Synopsis: V4.1.x
sramRetentionTest [--slot number][-passcnt count]
[-ports itemlist][-skip bitmask][-delay value]
Availability
Admin
Release
V3.1.x and V4.1.x
Description
Use this command to verify that data written into the miscellaneous SRAMs in the
ASIC are retained after a 10 second wait. The test method is to write a fill pattern
to all SRAMs, wait 10 seconds, and then read all SRAMs checking that data read
matches data previously written. Then the test is repeated using the
complementary version of the pattern. For V4.1.x, the test will use four
QUAD_FILL patterns and one QUAD_RAMP pattern with random seed.
The following patterns are used:
0xffffffff (and 0x00000000)
0x55555555 (and 0xaaaaaaaa)
0x33333333 (and 0xcccccccc)
0x0f0f0f0f (and 0xf0f0f0f0)
QUAD_RAMP with a random seed value (and its invert) (V4.1.x only)
Note: The sramRetentionTest command may not be executed on an
operational switch. You must first disable the switch using the switchDisable
command.
sramRetentionTest