Datasheet

7
Parameter Symbol Min. Typ. Max. Units Test Conditions Fig. Note
Propagation Delay Time to High
Output Level
t
PLH
0.1 0.2 0.7 µs R
g
= 75W, C
g
= 1.5 nF,
f = 10 kHz,
Duty Cycle = 50%,
I
F
= 7 mA, V
CC
= 30 V
8, 9,
10, 11,
12, 15
13
Propagation Delay Time to Low
Output Level
t
PHL
0.1 0.3 0.7 µs 13
Propagation Delay Dierence
Between Any Two Parts or Channels
PDD -0.5 0.5 µs 10
Rise Time t
R
50 ns
Fall Time t
F
50 ns
Output High Level Common Mode
Transient Immunity
|CM
H
| 10 kV/µs T
A
= 25°C,
V
CM
= 1000 V
16 11
Output Low Level CommonMode
Transient Immunity
|CM
L
| 10 kV/µs 16 12
Parameter Symbol Min. Typ. Max. Units Test Conditions Fig. Note
Input-Output Momentary
Withstand Voltage
V
ISO
3750 V
rms
T
A
= 25°C,
RH < 50% for 1 min.
8, 9
Input-Output Resistance R
I-O
10
12
V
I-O
= 500 V 9
Input-Output Capacitance C
I-O
0.6 pF Freq=1 MHz
Notes:
1. Derate linearly above 70°C free air temperature at a rate of 0.3 mA/°C.
2. Maximum pulse width = 10 µs, maximum duty cycle = 0.2%. This value is intended to allow for component tolerances for designs with I
O
peak
minimum = 0.2 A. See Application section for additional details on limiting I
OL
peak.
3. Derate linearly above 85°C, free air temperature at the rate of 4.0 mW/°C.
4. Input power dissipation does not require derating.
5. Maximum pulse width = 50 µs, maximum duty cycle = 0.5%.
6. In this test, V
OH
is measured with a DC load current. When driving capacitive load V
OH
will approach V
CC
as I
OH
approaches zero amps.
7. Maximum pulse width = 1 ms, maximum duty cycle = 20%.
8. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage > 4500 V
rms
for 1 second (leakage detection
current limit I
I-O
< 5 µA). This test is performed before 100% production test for partial discharge (method B) shown in the IEC/EN/DIN EN 60747-5-2
Insulation Characteristics Table, if applicable.
9. Device considered a two-terminal device: pins on input side shorted together and pins on output side shorted together.
10. PDD is the dierence between t
PHL
and t
PLH
between any two parts or channels under the same test conditions.
11. Common mode transient immunity in the high state is the maximum tolerable |dV
CM
/dt| of the common mode pulse V
CM
to assure that the output
will remain in the high state (i.e. V
O
> 6.0 V).
12. Common mode transient immunity in a low state is the maximum tolerable |dV
CM
/dt| of the common mode pulse, V
CM
, to assure that the output
will remain in a low state (i.e. V
O
< 1.0 V).
13. This load condition approximates the gate load of a 1200 V/20 A IGBT.
14. The power supply current increases when operating frequency and Q
g
of the driven IGBT increases.
Table 6. Switching Specications (AC)
Over recommended operating conditions unless otherwise specied.
Table 7. Package Characteristics