Datasheet
TEST ITEMS AND RESULTS
etoN snoitidnoC tseT metI tseT
Number of
Damaged
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+HDW5HIORZ6ROGHULQJ
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Tald=260±5℃ 4sec
(Leadfree Solder)
2 times 0/50
6ROGHUDELOLW\
5HIORZ6ROGHULQJ
-(,7$('
Tald=215±5℃ 3sec
(Lead Solder)
1 time over
95%
0/50
7KHUPDO6KRFN
0,/67''
0,/67'
0,/ 67'
0℃ - 100℃
15sec.15sec
20cycles 0/50
7HPSHUDWXUH&\FOH
-(,7$('
-40℃ - 25℃ - 100℃ - 25℃
30min. 5min. 30min. 5min
100 cycles 0/50
0RLVWXUH5HVLVWDQFH&\FOLF
-(,7$('
25℃ - 65℃- -10℃
90%RH 24hrs/1cycle
10 cycles 0/50
7HPSHUDWXUH+XPLGLW\
6WRUDJH
0,/67'%
-,6&%
Ta=60℃ RH=90%
1000hrs 0/50
/RZ7HPSHUDWXUH6WRUDJH -,6&% Ta=-40℃ 05/0 srh0001
6WHDG\6WDWH2SHUDWLQJ/LIH
RI+LJK+XPLGLW\+HDW
0,/67'%
-,6&%
85℃,RH=85%,If=20mA 500hrs 0/50
JUDGMENT CRITERIA OF FAILURE FOR THE RELIABILITY
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9)9
2.1*U revO Am02=FI
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,5X$
2*U revO V5=RV
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,9PFG
5.0*S woleB Am02=FI
1RWH8PHDQVWKHXSSHUOLPLWRIVSHFLILHGFKDUDFWHULVWLFV6PHDQVLQLWLDOYDOXH
0HDVXUPHQWVKDOOEHWDNHQEHWZHHQKRXUVDQGDIWHUWKHWHVWSLHFHVKDYHEHHQUHWXUQHGWR
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RELIABILITY







