User Manual

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4. Connect the component under test to the test leads or insert it into
the test fixture.
5. Press the TRIG key to perform a bin comparison and log the
corresponding bin count result.
6. Remove the device under test from the test leads or test fixture.
7. Repeat steps 1 – 3 for more components to be tested.
8. Press the STOP softkey to stop the bin comparison.
9. Use the CLEAR softkey to clear the bin count results.
NOTE: You may save the bin comparison test results to an external USB flash
drive. To do so, please refer to the Save a Measurement Result section.
3.6 Sweep Function
The sweep function scans the frequency over the component under test. It
shows a full spectrum of the component characteristics in a very easy to
operate method. It can also sweep the frequency linearly or logarithmically to
provide better understanding of the component. Users can also view data
either by a graph or by a table and obtain up to 300 points in one sweep.
Linear Sweep Mode
In linear sweep mode, the unit will sweep the frequency linearly from start
frequency to stop frequency. The following will be displayed for the “GRAPH”
display: