User Manual

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 Decoded text is truncated at the end of the associated frame when there is insufficient space
within frame boundaries.
 Pink vertical bars indicate you need to expand the horizontal scale (and run again) to see
decode.
 Red dots in the decode line indicate that there is data that is not being displayed. Scroll or
expand the horizontal scale to view the information.
 Unknown bus values (undefined or error conditions) are drawn in red.
Interpreting LIN Lister Data
In addition to the standard Time column, the LIN Lister contains these columns:
 ID: Frame ID.
 Data: Data bytes.
 Data Length: Length of data.
 ID Check: ID parity error.
 Data Check: Data error.
16 Digital Channels (LA2560 + LP2560)
This chapter describes how to use the digital channels of a Mixed-Single Oscilloscope (MSO). The
digital channels are enabled on the 2560 series that have installed the MSO license. To purchase
a license please fill out the license request form and contact B&K Precisions.
16.1 Connecting Digital Probes to Device under Test
To connect the digital probes to the device under test:
1. Turn off the power supply to the device under test. This can prevent damage that
could occur if two lines are shorted together while making connections. The
oscilloscope does not have any voltage at the probes.
2. Connect the digital probe cable LP2560 to the digital channels connector D0-D15 on
the front panel of the 2560. The digital probe cable is keyed so you can connect it
only one way. You do not need to power-off the oscilloscope. The two ports of the
digital probe cable are the same, they do not have a specific orientation to connect
them to the LP2560.
3. Connect a SMD Mini-grabber test clip to one of the digital ground pins of the probe
and then connect the grabber to ground in the device under test. This will improve
the signal fidelity and makes sure the oscilloscope gives accurate measurements.
4. Connect a flying lead probe to one of the digital probe digital channel pins; connect
a grabber to the flying lead probe, and then connect the grabber to a node in the
circuit you wish to test.